Industry Directory | Consultant / Service Provider / Distributor / Equipment Dealer / Broker / Auctions / Manufacturer / Manufacturer's Representative
DONGGUAN KINGSUN AUTOMATION TECHNOLOGY CO.,LTD is a company which mainly provide used and new SMT parts, provide repair SMT key parts service,new/used SMT machine trading,SMT consumables and Peripherals equipment,Clean room, ESD..
Industry Directory | Manufacturer
specialized in the filed of component level industrial electronics repair,CyberOptics laser repair:Juki laser,Yamaha laser,Samsung laser,Tenryu laser,Philips/Assembleon laser etc.,and repair all kinds of JUKI industrial circuit board:Juki laser unit(KE700 KE2000 FX-1 KE2070 KE2080),laser control card,I/O card,Cpu card,Image card,Sub cpu card,Xmp card,AC/DC servo moto,servo driver,Industrial monit
Dingji technology company is specialized in the filed of Cyberoptics laser repair:Juki laser,Yamaha laser,Samsung laser,Tenryu laser,Philips/Assembleon laser etc.,and repair all kinds of JUKI industrial circuit board:Juki laser unit(730/750/760/2010/
Dingji technology company is specialized in the filed of component level industrial electronics repair,CyberOptics laser repair:Juki laser unit(KE730/740/750/760/2010/2020/2030/2050/2060/FX-1/2070/2080),Yamaha laser,Samsung laser,Tenryu laser,Philips
Electronics Forum | Sat Aug 08 09:45:11 EDT 2015 | edwaterfall01
It would be helpful to know what happened before the error occurred. Do you have another machine so that you can swap some boards? The Force CPU, (machine controller) located in the VME, is responsible for controlling all machine-related activities.
Electronics Forum | Tue Feb 12 12:47:02 EST 2019 | slthomas
Someone with some more definitive knowledge of these machines will no doubt chime in at some point, but my thought was that the "A-table" is just a data table that stores I/O information. Thus, being "off in A-table YV100X:N2323 YV100XT:n2223" just m
Used SMT Equipment | In-Circuit Testers
Leader LV7770 Multi-SDI Rasterizer includes 8 channel AES/EBU Leader LV7770 Multi SDI Rasterizer Features: Configurable & AffordableAccepts two 3G, Dual Link, or SD/HD-SDI sources that can be displayed simultaneously or individually. Picture
Used SMT Equipment | In-Circuit Testers
Aeroflex IFR FB100A Aeroflex-IFR FB100A BER Test System The FB100A is a modular, expandable, high data rate BER (Bit Error Rate) test system. With operation from DC to 160 Mb/s, serial and/or parallel data interfacing and INSTALOK synchroniz
Industry News | 2016-08-13 19:54:46.0
JTAG Technologies return to SMTA in 2016 to premiere several new hardware products for PCB testing and In-System [Device] Programming.
Industry News | 2013-01-02 16:01:34.0
A Convenienient and informative online tutorial about Design and Assembly Process Challenges for Bottom Terminations Components
Parts & Supplies | Pick and Place/Feeders
filter KLW-M8527-00 for Yamaha Philips machine KLW-M8527-00 filter KHG-M4896-01 LIGHT,ERROR 2 CE 32 LC1-M13H2-00 SWITCH,EMG ASSY 1 33 KGK-M5381-00 EMG PLATE 1 34 KKE-M6554-A0 MAIN SWITCH ASSY 1 35 KKX-M8596-A0 PRESSURE GAUGE 2 36 KLF-M4267-1
Parts & Supplies | SMT Equipment
KGT-M4570-00X I O BOARD ASSY. YG200 KJ0-M5810-A22 Philips Eclipse II Yamaha Motor Driver Board Assembly, Circuit Boards. KJ0-M4200-02X SYSTEM UNIT ASSEMBLY 1 KG7-M441H-B1X VISION BOARD ASSEMBLY Sel. KJ0-M5810-A2X DRIVER BOARD ASSY 1 YVL88
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
Contact Us Sales manager: Mac Xie Mobile: +8618020714662(Whatsapp) Email: at@mooreplc.com Skype: +8618020714662 Contact Us ✭Product Overview✭ Place of Origin:USA Brand Name:PROVIBTECH Certification:CO.CQ Model Number:TM0181-A40-B01 ✭Com
FLX500™ is a compact, self-contained automated system for programming memory and microcontroller devices. At home on the desktop, in the lab, or on the production line, FLX500 drastically reduces quality problems inherent in manual gang programming
Career Center | rawalpindi, Pakistan | Production
Handling the production line including two SWISS pick and place machines cobra and paraquda ,tucano printer reflow oven ,samsung loader and unloader.Hand on experience with 3D camera inspection system and solder paste height measuring instrument and
Career Center | Fredericksburg, Virginia USA | Engineering,Maintenance,Management,Production,Quality Control
• Certified CP643 Loader Calibration – FUJI American Chicago, IL 2001. • Certified - Cookson Performance Solutions BTU - PARAGON - P150 Oven – Maintenance & Electrical Troubleshooting Charlotte, NC 2001. • Certified UNIVERSAL (GSM) Platform: Operat
Heller Industries Inc. | https://hellerindustries.com/wp-includes/js/dist/vendor/wp-polyfill-url.min.js?ver=3.6.4
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1st Place Machinery Inc. | http://www.firstplacemachinery.com/smt_pcb_pic_place_philipsparts.html
Philips Spare Parts Philips Pick and Place Machine Spare Parts "New" Topaz - Eclipse - Emarald - Comet Quantity Part Number Description 32 5322-530-51373 O-RING, NOZZLE