Used SMT Equipment | Pick and Place/Feeders
Mycronic MY200 SX-14 Placement System, Year 2015, DVS Enhanced Vision Upgrade, Conveyorized System Including Rear Conveyors, Electrical Two Pole, Optical Centering, Conveyor, Shared Database, Hydra, Z High Speed, Hydra High Speed, Auto Teach, Line Sc
Used SMT Equipment | Pick and Place/Feeders
Mycronic MY200 SX-14 Placement System, Year 2015, DVS Enhanced Vision Upgrade, Conveyorized System Including Rear Conveyors, Electrical Two Pole, Optical Centering, Conveyor, Shared Database, Hydra, Z High Speed, Hydra High Speed, Auto Teach, Line Sc
Used SMT Equipment | Pick and Place/Feeders
AUCTION/ Negotiated sale item from the continuing operations of MASTERWORKS ELECTRONICS WHERE: SAN DIEGO CALIFORNIA WHEN: 2/25-2/27 2010 vintage Phillips Assembleon MG-1 Pick and Place w/LCS, Placement rates up to 24k components per hour
New Equipment | Assembly Services
PCB Assembly Quickturn and Prototype PCB Assembly. That's what you need, that's what we do. We can support small engineering projects up to full turn-key, medium volume production. With in-house process verification tools like AOI, Xray and Ersas
H610 with automatic recognition function of machine vision, using high-precision Servo drive system to achieve fast and accuracy alignment .It build in independent cleaning system, the cycle time less than 7s,ensure the high printing quality of solde
» Fully automated 200 / 300mm EFEM wafer capability » Patented vibration squeegee technology » Dual or Single load port available Milara takes its combined system technology practice one step further with the development of the new AWPb 300 Wafer Pri
Test Fixtures and Programming NEA LLC offers test fixtures and programming services for ATE equipment including Agilent 3070, Genrad 228x and Teradyne 18xx testers. A high end CNC machine gives us the ability to supply high quality test fixtures wi
A modern alternative of the bed-of-nails system, CAMtek offers Flying Probe Test as a universal platform for a cost effective test solution. Dual Side Probing Optical (AOI) Test Open Pin Scan Parametric Test Power-Up Functional Test Capable
New Equipment | Test Equipment
For wearable devices and slimmer designed electronic products, we provide you two kinds of probe style test connector: 0.2mm and 0.35mm. Now you are allowed to achieve side access connection by 0.2mm probe directly, simulate FFC / FPC connectors; or
H450 with automatic recognition function of machine vision, using high-precision Servo drive system to achieve fast and accuracy alignment .The precision can reach +/- 0.01mm.It build in independent cleaning system, the cycle time less than7s,ensure
