New SMT Equipment: ratio rules (4)

DEK ProActiv - Process Technology for Unprecedented Paste Transfer Efficiency

DEK ProActiv - Process Technology for Unprecedented Paste Transfer Efficiency

New Equipment | Printing

ProActiv is a breakthrough process technology that dramatically improves solder paste transfer efficiency with stencil printing. It redefines the boundaries of Area Ratio rules for stencil apertures, which dictate the smallest apertures that can be p

ASM Assembly Systems (DEK)

GE Bently Nevada  330104-00-24-10-02-00 Proximity Probe

GE Bently Nevada 330104-00-24-10-02-00 Proximity Probe

New Equipment | Industrial Automation

  Sandy.[mailto:unity@mvme.cn]    Sandy.[WhatsApp/Skype/Mobile:+8618020776786]     Sandy.[Quote to you within the shortest possible time with our best price]   Warranty: up to 12 months Shipping: fast delivery is available NEW+ORIGINAL+IN STOCK+ONE

XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD.

Electronics Forum: ratio rules (41)

Solder Paste Type for QFN Printing

Electronics Forum | Wed Aug 25 15:24:07 EDT 2010 | mikesewell

Whatever you would normally use to print that size part on the pcb should work. Same aspect ratio rules apply for release.

Double Reflow (Weight/Surface Area) Ratio Rule

Electronics Forum | Sat Mar 21 12:19:51 EST 1998 | David Pick

I have read somewhere of a ratio of component weight vs. surace contact area rule for double reflow soldering. This ratio is the maximum weight vs. surface tension to hold a component on during the second reflow. With this number, a person could weig

Industry News: ratio rules (18)

Machine Vision Products redefines the cost and performance ratio - announcing the new Supra-E AOI system at APEX 2009, Las Vegas.

Industry News | 2009-03-27 13:58:34.0

Carlsbad, CA � March 27th, 2009: Machine Vision Products today announced the new Supra-E AOI will be introduced at Booth 1437 at APEX 2009 in Las Vegas from March 31st to April 2nd.

Machine Vision Products, Inc

Machine Vision Products redefines the cost and performance ratio � demonstrating the new Supra-E AOI system at Nepcon China 2009 in Shanghai.

Industry News | 2009-04-17 16:59:19.0

Shanghai, P.R.C � Apr 17th, 2009: Machine Vision Products today announced the recently introduced new Supra-E AOI will be demonstrated at Booth 4F18 at Nepcon China 2009 in Shanghai from Apr 21st to April 24th.

Machine Vision Products, Inc

Technical Library: ratio rules (4)

Low Surface Energy Coatings Rewrites the Area Ratio Rules

Technical Library | 2013-06-20 14:33:12.0

With today's consumer technologies driving the need for denser and more compact devices, the assembly process for surface mounted devices has becoming increasingly more difficult. With the mixture of components requiring a broader range of print deposition volume, various techniques are in use in an attempt to ensure consistent and appropriate paste volume is achieved. Some of these techniques include step etching a stencil locally on a targeted device, promoting electroformed smooth wall nickel stencils, through to laser cutting newer grade stencil materials. This paper focuses on the relevant attributes that affect the properties of solder paste release and introduces the effects of surface free energy with respect to key elements that make up the stencil printing process.

Assembly Process Technologies LLC

Stencil Printing Process Tools for Miniaturisation and High Yield Processing

Technical Library | 2023-06-12 19:00:21.0

The SMT print process is now very mature and well understood. However as consumers continually push for new electronic products, with increased functionality and smaller form factor, the boundaries of the whole assembly process are continually being challenged. Miniaturisation raises a number of issues for the stencil printing process. How small can we print? What are the tightest pitches? Can we print small deposits next too large for high mix technology assemblies? How closely can we place components for high density products? ...And then on top of this, how can we satisfy some of the cost pressures through the whole supply chain and improve yield in the production process! Today we are operating close to the limits of the stencil printing process. The area ratio rule (the relationship between stencil aperture opening and aperture surface area) fundamentally dictates what can and cannot be achieved in a print process. For next generation components and assembly processes these established rules need to be broken! New stencil printing techniques are becoming available which address some of these challenges. Active squeegees have been shown to push area ratio limits to new boundaries, permitting printing for next generation 0.3CSP technology. Results also indicate there are potential yield benefits for today's leading edge components as well. Stencil coatings are also showing promise. In tests performed to date it is becoming apparent that certain coatings can provide higher yield processing by extending the number of prints that can be performed in-between stencil cleans during a print process. Preliminary test results relating to the stencil coating technology and how they impact miniaturisation and high yield processing will be presented.

ASM Assembly Systems (DEK)

Career Center - Jobs: ratio rules (1)

SMT Manufacturing Engineer - 2nd Shift

Career Center | Houston, Texas USA | Engineering,Management,Production

SMT Manufacturing Engineer – 2nd Shift Hunting Innova is a Houston based company serving industrial, energy, medical, defense and aerospace segments of the Electronic Manufacturing Services (EMS) Industry since 1989.  Hunting Innova is located in N

Hunting Innova

Career Center - Resumes: ratio rules (1)

Electronics Manufacturing /SMT/Quality/ISO/6 sigma

Career Center | , | 2013-03-07 05:50:27.0

Looking for Leader ship Opprtunity in Electronics Manufacturing Plant in India

Express Newsletter: ratio rules (93)

Partner Websites: ratio rules (4)

ECSS-Q-ST-70-18C

| https://www.eptac.com/wp-content/uploads/2015/03/ecss_q_st_70_18c-space-product-assurance-rf-coax-cables.pdf

‐18C  15 November 2008  Second issue  The following is a summary of changes between ECSS‐Q‐70‐18A and the  present issue:  • Redrafting ECSS‐Q‐70‐18A according to ECSS drafting rules and new  template.  • Reorganization of the content to separate descriptive text and  requirements, and creation of DRD.    3  ECSS‐Q‐ST‐70‐18C  15 November 2008  Table of contents Change log


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