Full Site - : recover (Page 4 of 208)

IT Operations Analyst (M10097)

Career Center | mountain view, California USA | Technical Support

IT Operations Analyst (M10097) Mountain View, CA As a IT Operations Analyst you will be responsible for the day to day operations of all Production Systems and Services to assure effective systems availability and performance needed to support overal

Spectra-Physics

GES Associates LLC

Industry Directory | Equipment Dealer / Broker / Auctions

GES buys and sells equipment as guaranteed functional, refurbished, or "as is" depending on customers’ needs. GES maintains an extensive equipment inventory, conducts auctions, and equipment sourcing.

Pyrolysis of Printed Circuit Boards

Technical Library | 2013-10-03 16:05:39.0

Printed Circuit Board (PCB) is an essential component of almost all electrical and electronic equipments. The rapid growth of the use of such equipments has contributed enormously to the generation of large quantity of waste PCBs. The WPCBs not only contain valuable metals but also a large variety of hazardous materials. Conventional treatments of such WPCBs have their own limitations. By pyrolysis of WPCBs, it is not only possible to obtain the organic part of it as a fuel or useful chemical but can make further processing to recover metals much easier and efficient. In the present work, a kinetic study on the low temperature pyrolysis of WPCBs using a thermogravimetric analyser has been attempted...

Indian Institute of Technology ( Banaras Hindu University )

Good Product Quality Comes From Good Design for Test Strategies

Technical Library | 2015-12-17 17:24:17.0

Product quality can be improved through proper application of design for test (DFT) strategies. With today's shrinking product sizes and increasing functionality, it is difficult to get good test coverage of loaded printed circuit boards due to the loss of test access. Advances in test techniques, such as boundary scan, help to recover this loss of test coverage. However, many of these test techniques need to be designed into the product to be effective.This paper will discuss how to maximize the benefits of boundary scan test, including specific examples of how designers should select the right component, connect multiple boundary scan components in chains, add test access to the boundary scan TAP ports, etc. A discussion of DFT guidelines for PCB layout designers is also included. Finally, this paper will include a description of some advanced test methods used in in-circuit tests, such as vectorless test and special probing methods, which are implemented to improve test coverage on printed circuit boards with limited test access.

Agilent Technologies, Inc.

Estimating Recycling Return of Integrated Circuits Using Computer Vision on Printed Circuit Boards

Technical Library | 2021-06-07 19:06:32.0

The technological growth of the last decades has brought many improvements in daily life, but also concerns on how to deal with electronic waste. Electrical and electronic equipment waste is the fastest-growing rate in the industrialized world. One of the elements of electronic equipment is the printed circuit board (PCB) and almost every electronic equipment has a PCB inside it. While waste PCB (WPCB) recycling may result in the recovery of potentially precious materials and the reuse of some components, it is a challenging task because its composition diversity requires a cautious pre-processing stage to achieve optimal recycling outcomes. Our research focused on proposing a method to evaluate the economic feasibility of recycling integrated circuits (ICs) from WPCB. The proposed method can help decide whether to dismantle a separate WPCB before the physical or mechanical recycling process and consists of estimating the IC area from a WPCB, calculating the IC's weight using surface density, and estimating how much metal can be recovered by recycling those ICs. To estimate the IC area in a WPCB, we used a state-of-the-art object detection deep learning model (YOLO) and the PCB DSLR image dataset to detect the WPCB's ICs. Regarding IC detection, the best result was obtained with the partitioned analysis of each image through a sliding window, thus creating new images of smaller dimensions, reaching 86.77% mAP. As a final result, we estimate that the Deep PCB Dataset has a total of 1079.18 g of ICs, from which it would be possible to recover at least 909.94 g of metals and silicon elements from all WPCBs' ICs. Since there is a high variability in the compositions of WPCBs, it is possible to calculate the gross income for each WPCB and use it as a decision criterion for the type of pre-processing.

University of Pernambuco

Agilent 83446B

Agilent 83446B

Used SMT Equipment | In-Circuit Testers

The Agilent 83446A/B lightwave clock/data receivers are designed to extract clock and data information from digitally modulated lightwave signals. They operate at the following SONET/SDH rates: Agilent 83446A ... 2.48832 Gb/s Agilent 83446B ...622.

Test Equipment Connection

Agilent 83446B

Agilent 83446B

Used SMT Equipment | In-Circuit Testers

The Agilent 83446A/B lightwave clock/data receivers are designed to extract clock and data information from digitally modulated lightwave signals. They operate at the following SONET/SDH rates: Agilent 83446A ... 2.48832 Gb/s Agilent 83446B ...622.

Test Equipment Connection

Agilent 83446B

Agilent 83446B

Used SMT Equipment | In-Circuit Testers

The Agilent 83446A/B lightwave clock/data receivers are designed to extract clock and data information from digitally modulated lightwave signals. They operate at the following SONET/SDH rates: Agilent 83446A ... 2.48832 Gb/s Agilent 83446B ...622.

Test Equipment Connection

Agilent 83446B

Agilent 83446B

Used SMT Equipment | In-Circuit Testers

Agilent 83446B Lightwave Clock Data Receiver The Agilent 83446A/B lightwave clock/data receivers are designed to extract clock and data information from digitally modulated lightwave signals. They operate at the following SONET/SDH rates: Agil

Test Equipment Connection

Agilent 83446B

Agilent 83446B

Used SMT Equipment | In-Circuit Testers

Agilent 83446B Lightwave Clock Data ReceiverThe Agilent 83446A/B lightwave clock/data receivers are designed to extract clock and data information from digitally modulated lightwave signals. They operate at the following SONET/SDH rates: Agilent 8344

Test Equipment Connection


recover searches for Companies, Equipment, Machines, Suppliers & Information