Parts & Supplies | Assembly Accessories
Detailed Product Description Brand: Ipulse Machine Model: F1 Model: 24mm Part Number: LG4-M6A00-00 Part Name: Ipulse Feeder Country: Japan I-PULSE F1-24mm Feeder LG4-M6A00-00 Ipulse 24mm feeder Specifications: 00322180S03 Application Ipulse
Parts & Supplies | Assembly Accessories
Detailed Product Description Brand: Ipulse Machine Model: F1 Model: 44mm Part Number: LG4-M8A00-00 Part Name: Ipulse Feeder Country: Japan Ipulse F1-44MM Feeder LG4-M8A00-00 Ipulse 44mm feeder Specifications: 00322180S03 Application Ipulse
Parts & Supplies | Assembly Accessories
Detailed Product Description Brand: Ipulse Machine Model: F1 Model: 56mm Part Number: LG4-M9A00-00 Part Name: Ipulse Feeder Country: Japan Ipulse F1-56MM Feeder LG4-M9A00-00 Ipulse Feeder Specifications: 00322180S03 Application Ipulse SMT M
Parts & Supplies | Screen Printers
Standard non-standard customized SMT supplies JUKI automatic printing machine steel squeegee I. Panasonic plug-in machine models include: AJ, AVB, AVF, AVG, AVK, AVK2, AVK3, AV131, RT, JV, JVK, JVK2, JVK3, RH, RH2, RH3, RH5, RH6, RHS, RHS2, RHS2B,
ACI Technologies Inc. (ACI) is a scientific research corporation dedicated to the advancement of electronics manufacturing processes and materials for The Department of Defense and industry. This video provides an overview of our commercial service
Used SMT Equipment | X-Ray Inspection
Make: Creative Electron Model: TruView Cube Mini X-Ray System Vintage: 2015 Details: • 80Kv • Spot Size: 33 um (Minifocus) • X-Ray Camera: 1’ x 1.5”, 1FPS, 14-bit flat panel • Sample Manipulation: Motorized XY t
Technical Library | 2019-09-23 09:35:00.0
Failure analysis (FA), by its very nature, is needed only when things goawry. Before any testing is performed on the sample, a decision mustbe made as to whether or not the sample is allowed to be destroyedin the process of testing. Non-destructive testing can allow for re-use of the assembly since the functionality is not altered, but there still remains the possibility that inadvertent damage can occur through the course of the analysis. If non-destructive testing is preferred, then the following types of analysis can be performed. The testing can be divided into four categories: visual, X-ray (X-ray imaging and X-ray fluorescence), cleanliness (resistivity of solvent extract, ion chromatography, and Fourier transform infrared spectroscopy), and mechanical (non-destructive wire bond pull).
Technical Library | 2019-06-11 09:34:37.0
Recently ACI Technologies was asked to perform failure analysis on a hermetically sealed transistor for potential electrostatic discharge (ESD) or electrostatic overstress (EOS). ACI was asked to determine if the field-failed transistor was damaged by ESD or EOS. In order to properly assess the failure, additional samples were requested.
Events Calendar | Wed Mar 07 00:00:00 EST 2018 - Wed Mar 07 00:00:00 EST 2018 | ,
Solder Paste Qualification Testing - SMTA Webinar
Events Calendar | Tue Dec 11 00:00:00 EST 2018 - Tue Dec 11 00:00:00 EST 2018 | ,
Inspecting PWB Assemblies for Defects
