New Equipment | Test Equipment
New in 2015! Datest now offers the following services: Scanning Acoustic Microscopy (C-SAM) Analysis X-ray Fluorescence (XRF) Scanning Electron Microscopy (SEM) Fourier Transform Infrared Spectroscopy (FTIR) Analysis Energy Dispersive X-ra
New Equipment | Test Equipment
The CSM Instruments Micro-Hardness Tester provides over three decades of normal force range and thus is ideally suited to the mechanical characterization of hard coatings, thick soft coatings and bulk materials. It provides accurate and reproducible
Industry News | 2024-06-17 12:17:15.0
Nordson TEST & INSPECTION today announced plans to exhibit at SEMICON West 2024, scheduled to take place July 9-11 at the Moscone Center in San Francisco, California. Visitors to booth 1233 will have the opportunity to see demonstrations of Nordson's WaferSense® semiconductor sensors, Quadra Pro™ Manual X-Ray System (MXI), and Gen 7™ Acoustic Micro Imaging (AMI) system. Additionally, the innovative SpinSAM™ AMI system will be unveiled in a video presentation for the first time at the show.
![[SEC] SEM(Scanning Electron Microscope) SNE 4500M Plus Premium Version of Highest-end](https://img.youtube.com/vi/C9ny0wTR8mY/sddefault.jpg)
#SEM#SEC#??????? Model: SNE-4500M Plus (A) / (B) Resolution: 5nm (30kV, SE Image) Magnification: 30x~150,000x Detector: Secondary Electron(SE) / Backscattered Electron(BSE) Vacuum: High / Low Stage: X,Y, Z, R, T : Fully motorized Navigation mode wi
Industry Directory | Manufacturer
Pemtron develops and manufactures 3-D Solder Paste Inspection, 3-D Nano Profilers and Scanning Electron Microscopes
Industry Directory | Manufacturer
The inspection specialists with over 15 years experience in the AOI market. Manufacturers of Scanner Based AOI and Image Comparators. Distributors of high specification Video Microscopes, X-Ray & Camera Based AOI.
New Equipment | Test Equipment
The REVETEST® Scratch Testing instrument has become the industry standard for measuring hard-coated materials, with a typical coating thickness of several microns. Coatings may be organic or inorganic, covering Tribological, magnetic and decorative
The SNE-4500M Plus B is a top of the line tabletop Scanning Electron Microscope. It is easy to use and provides fast and reliable images with a maginification up to x150 000.
SNE-4500M Plus The Highest-end Tabletop SEM Cost-effective Table-top SEM with Max. 150,000x of magnification by miniaturizing modules. Able to scan images with high resolution of 5nm by the installation of the variable aperture with ease of us
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