Industry News | 2013-11-13 14:25:15.0
MIRTEC, “The Global Leader in Inspection Technology,” announces that it was awarded a 2013 Global Technology Award in the category of Inspection – AOI for its MV-9 2D/3D CoaXPress In-Line AOI Series.
Industry News | 2016-04-30 13:04:28.0
MIRTEC, “The Global Leader in Inspection Technology,” is pleased to announce that it was awarded the 2016 SMT China Vision Excellence Award in the category of Inspection & Testing – AOI for its MV-6 OMNI 3D AOI system. The award was presented to the company during a ceremony that took place April 26, 2016 at the Shanghai World Expo Exhibition & Convention Center during NEPCON China. MIRTEC’s MV-6 OMNI received the SMT China Vision Excellence Award for earning the top score in the AOI category.
Industry News | 2016-09-06 15:59:54.0
MIRTEC, “The Global Leader in Inspection Technology,” is pleased to announce plans to exhibit its Award Winning MV-6 OMNI 3D AOI System at the SMTA Guadalajara Expo & Tech Forum, scheduled to take place Oct. 5-6, 2016 at Hotel Riu Guadalajara.
Industry News | 2016-05-03 14:36:37.0
MIRTEC, “The Global Leader in Inspection Technology,” is pleased to announce that it was awarded the 2016 EM Asia Innovation Award in the category of Inspection & Testing – AOI for its MV-6 OMNI 3D AOI system. The award was presented to the company during a ceremony that took place April 26, 2016 at the Shanghai World Expo Exhibition & Convention Center during NEPCON China. MIRTEC’s MV-6 OMNI also earned the top score in the AOI category, resulting in an SMT China Vision Excellence Award.
Industry News | 2012-09-13 10:44:36.0
MIRTEC, “The Global Leader in Inspection Technology”, announced that it will premier its Technologically Advanced AOI Equipment at SMTAI Orlando 2012
Industry News | 2020-01-06 16:06:59.0
MIRTEC will premier its complete line of 3D AOI and SPI Inspection Systems in Booth #1900 at the 2020 IPC APEX EXPO. The premier technical conference and exhibition for the electronics manufacturing industry will take place Feb. 4-6, 2020 at the San Diego Convention Center.
Events Calendar | Tue Apr 21 00:00:00 EDT 2020 - Thu Apr 23 00:00:00 EDT 2020 | Amsterdam, Netherlands
Electronics in Harsh Environments Conference
Events Calendar | Tue May 17 00:00:00 EDT 2022 - Thu May 19 00:00:00 EDT 2022 | Amsterdam, Netherlands
Electronics in Harsh Environments Conference and Exhibition
Events Calendar | Tue May 17 00:00:00 EDT 2022 - Thu May 19 00:00:00 EDT 2022 | Amsterdam, Netherlands
Electronics in Harsh Environments Conference and Exhibition
Technical Library | 2019-09-03 17:06:09.0
Both optical and scanning electron microscopy (SEM) are powerful tools for failure analysis in electronics and are used for low and high magnification examination. This article will provide detailed, step by step information for examining solder joints.
