Industry News | 2003-04-21 09:53:12.0
Michael T. O'Neill and Peter J. Simone
Industry News | 2003-05-02 08:49:07.0
Group to Assemble Data by Package and Technology Type
Industry News | 2003-05-30 08:26:20.0
The inventors of this module type and holders of the patent are chief technical officer Kenneth J. Kledzik and president Jason C. Engle, both of San Clemente, California.
Industry News | 2003-07-03 08:45:09.0
Leading Electronic Manufacturing Service Provider Leverages Tradec Solution to Manage Commodity Cost and Accelerate the Quotation Process
Industry News | 2008-04-07 22:15:22.0
OXFORD, CT � March 31, 2008 � MIRTEC Corp., the AOI market leader in North America, announces that it has been awarded a 2008 NPI Award in the category of Test & Inspection, AOI for its MV-7L In-Line AOI System. The award was presented to the company during a Monday, March 31, 2008 ceremony that took place in the Mandalay Bay Resort & Convention Center in Las Vegas before the start of APEX 2008.
Industry News | 2008-07-19 15:38:37.0
OXFORD, CT � July 16, 2008 � MIRTEC, the global leader in Automated Optical Inspection Technology, announces that its MV-7L In-Line AOI System was named First Finalist in the category of Inspection Equipment & Services during the Advanced Packaging Award ceremony that took place on Wednesday, July 16, 2008 at the St. Regis Hotel Conservatory during the SEMICON West exhibition in San Francisco.
Industry News | 2009-12-03 22:49:57.0
Gene F. Wakefield Passed away on November 29, 2009 after a courageous battle with pancreatic cancer. He was born on December 22, 1933 in Albuquerque, New Mexico. He is survived by his wife, LaJuana. He leaves behind a daughter, Marvel Wakefield (Los Angeles, CA), two brothers, John Wakefield (Crawford, CO) and Roy Wakefield (Truckee, CA), three sisters, Lila Craig (Colorado Springs, CO), Mary Alyce Krist (Ft. Collins, CO) and Margaret Ann Foss (Buffalo, WY).
Industry News | 2012-10-17 14:13:01.0
MIRTEC, “The Global Leader in Inspection Technology”, announces that it has been awarded a 2012 Global Technology in the category of Inspection – AOI for its revolutionary MV-9 2D/3D In-Line AOI Series configured with MIRTEC’s exclusive OMNI-VISION® 3D Inspection Technology
Industry News | 2013-02-20 09:43:15.0
MIRTEC, “The Global Leader in Inspection Technology”, announces that it has been awarded the 2013 NPI Award in the category of Test & Inspection – AOI for its revolutionary MV-9 2D/3D In-Line AOI Series configured with MIRTEC’s exclusive OMNI-VISION® 3D Inspection Technology.
Industry News | 2013-12-05 16:48:11.0
MIRTEC, “The Global Leader in Inspection Technology,” announces that it has been selected as a finalist for the 2014 Best in Test Awards in the Machine Vision/Inspection category for its MV-9 2D/3D CoaXPress In-Line AOI Series. Since 1991, the Best in Test Awards have recognized the best in test products and test professionals.
