Full Site - : stress test (Page 11 of 54)

Equipment Reliability Institute - ERI

Industry Directory | Consultant / Service Provider / Training Provider

ERI is a specialized engineering school, focusing on the reliability and durability of hardware, upon the kinds of stresses that can shorten the life of hardware such as yours and upon appropriate tests to uncover weaknesses.

Associate Mechanical Engineer

Career Center | San Jose, California USA | Engineering

Associate Mechanical Engineer The main role of the Associate Mechanical Engineer will be to design, develop, and build apparatuses and fixtures, which purpose will be to test and control our clients' manufacturing output. Each of these apparatuses a

IST Engineering

Pickering Electronics

Industry Directory | Manufacturer

Manufacturers of high quality Reed Relays for Instrumentation and Automatic Test Equipment (ATE), High voltage switching, Low thermal EMF, Direct drive from CMOS, RF switching and other specialist applications.

Seika to Introduce New PCAS-1000A Stress Measurement Kit at APEX

Industry News | 2018-01-31 07:56:57.0

Seika Machinery today announced plans to introduce the new KYOWA ELECTRONIC INSTRUMENTS CO., LTD. PCAS-1000A Stress Measurement Kit. Company representatives will show the kit for the first time in Booth #2043 at the 2018 IPC APEX EXPO, scheduled to take place Feb. 27 - March 1, 2018 at the San Diego Convention Center in Ca.

Seika Machinery, Inc.

Product Reliability Engineering Manager

Career Center | San Jose, Nationwide | Engineering,Management

This world-renowned $13B organization is seeking a Product Reliability Engineering Manager (to report directly into the VP) for our San Jose, CA corporate technology office. We prefer candidates in the Silicon Valley area, but will consider candidat

The Engineering Connection

Test Facilities

Test Facilities

New Equipment |  

Our new test facility provides: EMI testing and regulatory approvals Product Safety testing and regulatory approvals NEBS and ETSI testing Temperature/Humidity testing Vibration testing Airflow testing Acoustic testing Thermal imaging Shipp

Quest Engineering Solutions, Inc.

Advances in Thin, 3D and MEMS Die Bond Strength Testing

Industry News | 2017-08-02 07:12:18.0

As market leader in bond testing, XYZTEC is pushing the technology forward. In this month's newsletter we highlight the recent advances in thin, 3D and MEMS die bond testing. As developments in thin die change the shape of our customers' products, three fundamental difficulties for the bond test have to be overcome:

XYZTEC bv

Shenzhen Tebo Software Technology Co.,Ltd.

Industry Directory | Consultant / Service Provider

Tebo ICT ATE FCT MDA test fixture Probe GC-PowerStation Testway Unisoft valor Trilogy-5000 UGS-Tecnomatix ODBinside Cadence CAMCAD IDF4.0 ECAD Strain-Gauge FEA BSA Board-Stress-Analysis CircuitWor

Head-in-Pillow BGA Defects

Technical Library | 2009-11-05 11:17:32.0

Head-in-pillow (HiP), also known as ball-and-socket, is a solder joint defect where the solder paste deposit wets the pad, but does not fully wet the ball. This results in a solder joint with enough of a connection to have electrical integrity, but lacking sufficient mechanical strength. Due to the lack of solder joint strength, these components may fail with very little mechanical or thermal stress. This potentially costly defect is not usually detected in functional testing, and only shows up as a failure in the field after the assembly has been exposed to some physical or thermal stress.

AIM Solder

Reliability of Embedded Planar Capacitors under Temperature and Voltage Stress

Technical Library | 2015-05-21 18:46:31.0

In this work the reliability of an embedded planar capacitor laminate under temperature and voltage stress is investigated. The capacitor laminate consisted of an epoxy-BaTiO3 composite sandwiched between two layers of copper. The test vehicle with the embedded capacitors was subjected to a temperature of 125oC and a voltage bias of 200 V for 1000 hours. Capacitance, dissipation factor, and insulation resistance were monitored in-situ. Failed capacitors exhibited a sharp drop in insulation resistance, indicating avalanche breakdown. The decrease in the capacitance after 1000 hours was no more than 8% for any of the devices monitored. The decrease in the capacitance was attributed to delamination in the embedded capacitor laminate and an increase in the spacing between the copper layers.

CALCE Center for Advanced Life Cycle Engineering


stress test searches for Companies, Equipment, Machines, Suppliers & Information

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