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Agilent Keysight 4156C

Agilent Keysight 4156C

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight 4156C Precision Semiconductor Parameter Analyzer Agilent 4156C Precision Semiconductor Parameter Analyzer Bench top solution for advanced device characterization. The superior low-current and low-voltage resolution and built-in

Test Equipment Connection

Indium Corporation's Technology Experts to Present at IPC Conference on Solder and Reliability

Industry News | 2013-11-08 17:55:20.0

Several Indium Corporation technology experts will present at the inaugural IPC Conference on Solder and Reliability November 13-14 in Costa Mesa, California.

Indium Corporation

Lab Testing Services

Lab Testing Services

New Equipment | Test Services

Nanovea offers clients worldwide to an unmatched range of Nano, Micro & Macro Mechanical, Metallurgy, Tribology and 3D Non-Contact or AFM materials characterization. Measurements include: Scratch Adhesion, Indentation Hardness, Wear Friction, Elastic

NANOVEA

Henkel CSP and BGA Underfills

Henkel CSP and BGA Underfills

New Equipment | Materials

Henkel offers innovative capillary flow underfill encapsulants for flip-chip, CSP and BGA devices. These are highly flowable, high purity, onecomponent encapsulants. They form a uniform and void-free underfill layer to improve reliability performance

Henkel Electronic Materials

A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism

Technical Library | 2019-12-26 19:13:52.0

Plated through hole (PTH) plays a critical role in printed circuit board (PCB) reliability. Thermal fatigue deformation of the PTH material is regarded as the primary factor affecting the lifetime of electrical devices. Numerous research efforts have focused on the failure mechanism model of PTH. However, most of the existing models were based on the one-dimensional structure hypothesis without taking the multilayered structure and external pad into consideration.In this paper, the constitutive relation of multilayered PTH is developed to establish the stress equation, and finite element analysis (FEA) is performed to locate the maximum stress and simulate the influence of the material properties. Finally, thermal cycle tests are conducted to verify the accuracy of the life prediction results. This model could be used in fatigue failure portable diagnosis and for life prediction of multilayered PCB.

Beihang University

Vibration and Shock course

Industry News | 2001-05-28 18:57:46.0

Billerica (Boston), USA

Equipment Reliability Institute - ERI

ThermalWorks

Industry Directory | Manufacturer

Thermally Managed ( up to 1000 W /m K thermal transfer rate ), CTE controlled, Very Rigid, Light Weight STABLCOR PCB / Substrate Technology


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