Used SMT Equipment | In-Circuit Testers
Rohde & Schwarz SFU Loaded with Options Rohde & Schwarz SFU-B1-B2-B3-B4-B5-B6-B10-B11-B15-B30-B31-B90-K1-K4-K15-K20-K21-K22-K23-K30-K32-K35-K37-K40-K41-K42-K43-K55-K60-K80-K190-K191-K192-K193-K194-K199-K221-K222-K354-K356-K363 The R&S SFU is th
Used SMT Equipment | In-Circuit Testers
Rohde & Schwarz SFU Loaded with Options Rohde & Schwarz SFU-B1-B2-B3-B4-B5-B6-B10-B11-B15-B30-B31-B90-K1-K4-K15-K20-K21-K22-K23-K30-K32-K35-K37-K40-K41-K42-K43-K55-K60-K80-K190-K191-K192-K193-K194-K199-K221-K222-K354-K356-K363 The R&S SFU is th
Technical Library | 2015-07-16 17:24:23.0
Qualification of electronic hardware from a corrosion resistance standpoint has traditionally relied on stressing the hardware in a variety of environments. Before the development of tests based on mixed flowing gas (MFG), hardware was typically exposed to temperature-humidity cycling. In the pre-1980s era, component feature sizes were relatively large. Corrosion, while it did occur, did not in general degrade reliability. There were rare instances of the data center environments releasing corrosive gases and corroding hardware. One that got a lot of publicity was the corrosion by sulfur-bearing gases given off by data center carpeting. More often, corrosion was due to corrosive flux residues left on as-manufactured printed circuit boards (PCBs) that led to ion migration induced electrical shorting. Ion migration induced failures also occurred inside the PCBs due to poor laminate quality and moisture trapped in the laminate layers.
Strata-Shield ENV� prevents ESD damage of all known categories during transportation and storage: Catastrophic failure Latent failure Mechanical damage Strata-Shield ENV� protects your ESDS in accordance with EN 61340-5-1: Low Charging Dissipative S
Strata-Shield ENV� prevents ESD damage of all known categories during transportation and storage: Catastrophic failure Latent failure Mechanical damage Strata-Shield ENV� protects your ESDS in accordance with EN 61340-5-1: Low Charging Dissipative S
Industry News | 2021-06-09 04:41:58.0
Seika Machinery, Inc. has seen increased popularity and demand of its process control systems.
Industry News | 2014-07-29 12:33:11.0
Several Indium Corporation technology experts will lead technical sessions at the Surface Mount Technology Association's International Conference and Exhibition (SMTAi) from Sept. 28-Oct. 2 in Rosemont, Ill.
Industry News | 2001-08-17 15:12:16.0
October 3-5, 2001, in Pico Rivera (LA), California
Industry News | 2010-12-09 13:15:01.0
STI Electronics announces that Casey Cooper, Electrical Engineering/Microelectronics Lab Manager, will present "Conformal Coating Evaluation for Use in Harsh Environments Utilizing a Modified SIR Test Protocol" at the upcoming Pan Pacific Microelectronics Symposium & Tabletop Exhibition, scheduled to take place January 18-20, 2011at the Hapuna Beach Prince Hotel on the Big Island of Hawaii.
Industry News | 2017-06-20 20:15:03.0
PDR introduces the benchtop based PDR IR-TS One IR Thermal Test System, designed to thermally cycle key critical components and assemblies to detect defects. Using PDR’s unique Non-Destructive Dual Thermal Stress Screening Process, based on a variation on HALT/HASS principles, the system is able to focus the testing on suspected problem areas to safely screen out early field failures caused by design, environmental, production and structural defects.
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