Used SMT Equipment | In-Circuit Testers
Takaya Flying Probe Model: APT-9400CJ Upgraded in 2011 Windows XP Takaya Software 5.0-1 for NT/2000/XP/7 Top and Bottom Side Probing Available Immediately Contact: Kyle@LELsemi.com
Used SMT Equipment | In-Circuit Testers
SME require a Takaya Flying probe, please quote all models CIF UK,
Used SMT Equipment | In-Circuit Testers
Takaya 8400CJ Flying Probe Test System Windows XP Version 4.1-7 Software AUCTION ITEM: www.xlineassets.com
Used SMT Equipment | In-Circuit Testers
Takaya APT-8400CJ IBE SMT Inventory ID : 120821-003 Takaya Serial Number : V0F19541 Vintage : SEP 2000 Details 220 VAC 50/60 Hz 9A Click Here for more details or to request a quote online... IBE SMT Equipment 281-259-9660 Office 800
We are proud to introduce Takaya's latest contribution to the world of fixtureless test...the APT-9401SL. With the ability to accept a board as large as 25"W x 26"L, the APT-9401SL is designed to meet the needs of the most demanding flying probe test
Used SMT Equipment | In-Circuit Testers
We are looking for Tayaka 9401 or 9411 flying probe tester which is in good condition. If anyone can provide, please send me the details.
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Used SMT Equipment | In-Circuit Testers
-Refurbished by OEM in March 2016 -Minimal operational hours Takaya 9411 CE Available! * 4-Movable Probes on the Top * 2-Fixed Probes on the Bottom * Test Area 540 x 460mm * APT System Software * Industry PC w/Windows 7 OS * PAL System Camer
Career Center | Carrollton, Texas USA | Engineering,Production,Technical Support
The primary responsibility of the test engineer is to provide engineering support for ICT and Flying Probe test processes in order to ensure throughput at the test areas. The candidate will be responsible for the following including, but not limite
Used SMT Equipment | In-Circuit Testers
Takaya Model APT8400 Flying Prober, Fixtureless Tester with AOI Vision •4 Probe Highspeed In-Circuit system •Bottom side 2 adjustable probes •Display 14 or 15 inch CRT Colour Monitor, VGA •Automatic Correction Function for X, Y co-ordinates •P
