Used SMT Equipment | In-Circuit Testers
Teradyne TS124LH System Configured With: - (01) System Controller - (01) REF/PIO2 - (01) HV-ICA - (05) Ultra I 124 Boards (9004-0385) - (01) 07V Alliance I Power Supply - (01) 20V Alliance I Power Supply - (01) 60V Alliance I Power Supply -
Used SMT Equipment | In-Circuit Testers
Teradyne TS128LH - (01) System Controller - (01) REF/PIO2 - (01) HV-ICA - (12) Ultra I 128 Boards (9004-0386) - (01) 07V Alliance I Power Supply - (01) 20V Alliance I Power Supply - (01) 60V Alliance I Power Supply - (01) Fixed Power Supply
Used SMT Equipment | In-Circuit Testers
Teradyne IP750EMP Image Sensor Test System Teradyne IP750EMP Tester includes IPC *4 plus Workstation. The Teradyne IP750EMP is the second generation image sensor tester from Teradyne, offering faster capture and processing of image sensor tes
Used SMT Equipment | In-Circuit Testers
Teradyne IP750EMP Image Sensor Test System Teradyne IP750EMP Tester includes IPC *4 plus Workstation. The Teradyne IP750EMP is the second generation image sensor tester from Teradyne, offering faster capture and processing of image sensor tes
Career Center | , Southeast Area USA | Technical Support
GroupASE is accepting applications for a Teradyne Test Technician in the Southeast Area. Position is open immediate. Please send resumes to groupase@smtnet.com.
We currently have two TS128 systems that can be configured to your requirements. We also offer: TS87LX, TS LH, 2287L, 2287i, 2284i, 2286i and 2283i....can custom configure, with licenses. Rental options are available. Call: 303-628-7722 today!
New Equipment | Test Equipment
Because all of Digitaltest's systems provide a non-multiplexed(1:1) archetecture, and digital driver/sensors that support 10V and low voltage logic, migration can be a simple operation. Details of each solution can be found at www.digitaltest.net.
Industry News | 2011-01-26 19:26:59.0
Teradyne announced the election of Timothy Guertin to its Board of Directors on January 24.
Technical Library | 2012-12-14 14:17:56.0
This article provides practical and affordable Design-for- Test (DFT) and Design-for-Inspection (DFI) methods that will have a positive impact on product costs, yield, reliability, and time-to-market. The properties of testability (including controllability and observability) will be analysed as they relate to analogue and digital design rules and their cause/effect, as well as the electrical and physical characteristics of proper PCB design.
Technical Library | 2012-12-26 14:18:24.0
Passive components including resistors, capacitors, inductors, and circuit-protection devices compose the highest percentage of all devices that are populated on today’s PCB assemblies. However, the successful isolation and testing of these components during ICT is perhaps the most challenging and the least understood of all modern-day validation practices.
.png)
winsouce.jpg)
