Career Center | Addison,Texas, Texas USA | Engineering
Strong background in design, development, debugging, integration and management of automated test equipment primarily Genrad 228x and 227x,and Teradyne 18xx and HP3070. Implemented networking system between tester and programming stations. created a
Improve test coverage and reduce cost. The XJTAG XJLink2-CFM adds the power of XJTAG’s boundary scan solution to the Teradyne TestStation, giving test access to hard-to-probe parts of a board. Both JTAG and non JTAG devices, such as Flash, RAM, Eth
New Equipment | Test Equipment
Limited access testing using IEEE1149.1 standard are now an essential part of manufacturing test strategy for complex and high node count digital boards. The Boundary scan tools (Scan Pathfinder) provided by Teradyne for the 228x and TestStation seri
New Equipment | Test Equipment
Affordable In-Circuit Test The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologie
Used SMT Equipment | In-Circuit Testers
TestStation LH, vintage 2008. QTY PN Desciption 1 093-169-00 TS LH FINAL ASSEMBLY 1 093-330-01 ULTRA II LH DOOR 1 9004002002 ALLIANCE I 0-7V@15A 1 9010034101 +5V@6A, +-15V@1A FIXED POWER SUPPLY 1 9014056500 OP XP/FRAMESCAN
New Equipment | Test Equipment
Inline test system for incircuit and functional tests with Teradyne measuring equipment ENGMATEC presented for the first time a test handler with integrated Test Station Inline TSi from Teradyne. On request of the Boston company Teradyne, a test
New Equipment | Test Equipment
Absolute Test Advantage (ATA) offers Absolute's customers extensive test capabilities. Just some of the state-of-the-art equipment is: ICT HP 3070 JTAG Technologies ProVision Development Station Takaya APT84XX Flying Probe In-Circuit Tes
New Equipment | Test Equipment
True Parallel Test The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs. It effectively doubles the test throughput of conventional
Industry News | 2014-10-20 23:43:13.0
XJTAG today announced the release of the XJLink2-CFM and XJLink2-CFMx. The new modules provide Teradyne users with integrated access to XJTAG’s powerful test and programming tools, operating under the control of the TestStation™ test program.
Career Center | Owings Mills, Maryland USA | Engineering,Production
In this role with TTCI you will specialize in the development of In-Circuit Test (ICT) sets for Agilent 3070 (Formerly HP) and/or Teradyne (Formerly GenRad) TestStation/228X test systems. Candidates should have at least 7 years experience with in-c
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