New Equipment | Test Equipment
Teradyne's TestStation High-Speed Inline Automated Handler is compatible with TestStation Multi-Site Inline configurations designed for the most productive and lowest cost in-circuit test package. Advantages The TestStation Automated Inline Handl
Industry News | 2015-08-20 13:59:22.0
Intrinsic Quality, LLC, is pleased to once again be considered one of the top test program developers in North America and has been granted renewed membership into the Teradyne Support Network. A proud TSN member since 2012, IQ has been regarded for expert test support with proven design engineering offering turn-key and custom in-circuit test solutions. Intrinsic Quality has been serving the Teradyne Network for over 30 years with professional fixtures and software programs.
New Equipment | Test Equipment
Affordable In-Circuit Test The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologie
New Equipment | Test Equipment
Because all of Digitaltest's systems provide a non-multiplexed(1:1) archetecture, and digital driver/sensors that support 10V and low voltage logic, migration can be a simple operation. Details of each solution can be found at www.digitaltest.net.
New Equipment | Test Equipment
Teradyne's TestStation Multi-Site systems deliver 2 to 4 times greater test capacity, delivering 200 to 400% greater productivity, and 40 to 50% lower total cost of test compared to a conventional single site system. Supporting a full range of MDA/IC
Used SMT Equipment | In-Circuit Testers
TestStation LH, vintage 2008. QTY PN Desciption 1 093-169-00 TS LH FINAL ASSEMBLY 1 093-330-01 ULTRA II LH DOOR 1 9004002002 ALLIANCE I 0-7V@15A 1 9010034101 +5V@6A, +-15V@1A FIXED POWER SUPPLY 1 9014056500 OP XP/FRAMESCAN
New Equipment | Test Equipment
True Parallel Test The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs. It effectively doubles the test throughput of conventional
Improve test coverage and reduce cost. The XJTAG XJLink2-CFM adds the power of XJTAG’s boundary scan solution to the Teradyne TestStation, giving test access to hard-to-probe parts of a board. Both JTAG and non JTAG devices, such as Flash, RAM, Eth
New Equipment | Test Equipment
Limited access testing using IEEE1149.1 standard are now an essential part of manufacturing test strategy for complex and high node count digital boards. The Boundary scan tools (Scan Pathfinder) provided by Teradyne for the 228x and TestStation seri
Industry Directory | Consultant / Service Provider / Manufacturer
TDM International is a supplier of expert GenRad 228x and Teradyne TestStation test engineering services and quality test fixtures.
