Full Site - : thermally induced cracks (Page 5 of 38)

Sherlock - Automated Design Analysis software

Sherlock - Automated Design Analysis software

New Equipment | Software

Wouldn't it be nice to see into the future? With Sherlock by DfR Solutions, you can. Sherlock is a new Automated Design Analysis Tool that allows you to predict product failure earlier in the design process, allowing you to design reliability right

DfR Solutions (acquired by ANSYS Inc)

Rehm Thermal Systems opens new Applications Center in Roswell, Ga.

Industry News | 2010-02-22 11:53:39.0

Rehm Thermal Systems has moved into a new Applications Center which will serve their North America marketplace. Located in the Atlanta suburb of Roswell, the new facility is designed to provide Rehm customers everything needed to characterize their convection and condensation reflow processes.

Rehm Thermal Systems Korea Limited

YINCAE’S New Highly Conductive Thermal Underfill: SMT 158D

Industry News | 2018-05-14 10:30:22.0

The world's first commercial diamond filled underfill.

YINCAE Advanced Materials, LLC.

Reliability of Lead-Free Solder Joints in Thermal Cycling

Industry News | 2011-12-30 23:35:59.0

Nihon Superior will issue a new series of guides on “Key Factors in the Selection of Lead-Free Solders.” This series is intended to address the challenges in choosing a reliable lead-free solder. The first guide in the series is titled “Reliability of Lead-Free Solder in Thermal Cycling.”

Nihon Superior Co., Ltd.

Rehm to showcase convection & condensation soldering expertise at Apex

Industry News | 2011-03-17 16:52:47.0

Rehm Thermal Systems is preparing to showcase its advanced thermal technologies at this year’s Apex exhibition, being held in Las Vegas from 12th – 14th April. As the only single source for convection and condensation soldering systems, Rehm will be demonstrating its unique capabilities from Booth 635.

Rehm Thermal Systems Korea Limited

YINCAE’S SMT 158A Receives High Praise

Industry News | 2018-05-18 15:47:55.0

As chips and packages become more complex, and installed in harsher conditions such as automobiles, the thermal conductivity of underfill materials becomes a greater concern. What can be done to prevent decreased reliability due to thermal dissipation issues?

YINCAE Advanced Materials, LLC.

A Study on Effects of Copper Wrap Specifications on Printed Circuit Board Reliability

Technical Library | 2021-07-20 20:02:29.0

During the manufacturing of printed circuit boards (PCBs) for a Flight Project, it was found that a European manufacturer was building its boards to a European standard that had no requirement for copper wrap on the vias. The amount of copper wrap that was measured on coupons from the panel containing the boards of interest was less than the amount specified in IPC-6012 Rev B, Class 3. To help determine the reliability and usability of the boards, three sets of tests and a simulation were run. The test results, along with results of simulation and destructive physical analysis, are presented in this paper. The first experiment involved subjecting coupons from the panels supplied by the European manufacturer to thermal cycling. After 17 000 cycles, the test was stopped with no failures. A second set of accelerated tests involved comparing the thermal fatigue life of test samples made from FR4 and polyimide with varying amounts of copper wrap. Again, the testing did not reveal any failures. The third test involved using interconnect stress test coupons with through-hole vias and blind vias that were subjected to elevated temperatures to accelerate fatigue failures. While there were failures, as expected, the failures were at barrel cracks. In addition to the experiments, this paper also discusses the results of finite-element analysis using simulation software that was used to model plated-through holes under thermal stress using a steady-state analysis, also showing the main failure mode was barrel cracking. The tests show that although copper wrap was sought as a better alternative to butt joints between barrel plating and copper foil layers, manufacturability remains challenging and attempts to meet the requirements often result in features that reduce the reliability of the boards. Experimental and simulation work discussed in this paper indicate that the standard requirements for copper wrap are not contributing to the overall board reliability, although it should be added that a design with a butt joint is going to be a higher risk than a reduced copper wrap design. The study further shows that procurement requirements for wrap plating thickness from Class 3 to Class 2 would pose little risk to reliability (minimum 5 μm/0.197 mil for all via types).Experimental results corroborated by modeling indicate that the stress maxima are internal to the barrels rather than at the wrap location. In fact, the existence of Cu wrap was determined to have no appreciable effect on reliability.

NASA Office Of Safety And Mission Assurance

Effect Of Voids On Thermo-Mechanical Reliability of Solder Joints

Technical Library | 2019-10-16 23:18:15.0

Despite being a continuous subject of discussion, the existence of voids and their effect on solder joint reliability has always been controversial. In this work we revisit previous works on the various types of voids, their origins and their effect on thermo-mechanical properties of solder joints. We focus on macro voids, intermetallics micro voids, and shrinkage voids, which result from solder paste and alloy characteristics. We compare results from the literature to our own experimental data, and use fatigue-crack initiation and propagation theory to support our findings. Through a series of examples, we show that size and location of macro voids are not the primary factor affecting solder joint mechanical and thermal fatigue life. Indeed, we observe that when these voids area conforms to the IPC-A-610 (D or F) or IPC-7095A standards, macro voids do not have any significant effect on thermal cycling or drop shock performance.

Alpha Assembly Solutions

Rehm Thermal Oxidation Process safeguards PV metallization yields

Industry News | 2009-10-26 14:48:05.0

A new thermal oxidation process from Rehm Thermal Systems has eliminated the challenge of residue contamination from photovoltaic metallization. In order to minimise maintenance and provide a cleaner process chamber, Rehm has innovatively implemented a proven method of thermal oxidation to enhance the performance of its RDS Drying Systems.

Rehm Thermal Systems Korea Limited

New Underfill from Zymet for 0.4-mm pitch POP's

Industry News | 2012-01-13 13:20:53.0

Zymet has introduced a new reworkable underfill encapsulant, CN-1736, designed to underfill 0.4-mm pitch Package-on-Package (POP) assemblies. It has low viscosity and a lower CTE than its predecessors. Plus it has greater flux compatibility, making it suitable for use with a broader range of solderpastes and tacky fluxes.

Zymet, Inc


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