Events Calendar | Thu Apr 22 00:00:00 EDT 2021 - Thu Apr 22 00:00:00 EDT 2021 | ,
Ohio Chapter Meeting: Industry 4.0 / Non-Destructive Failure Analysis
Industry News | 2018-04-11 20:04:01.0
SMTA Europe announces Session 3 Technical Program on Advanced Test Methods at the “Electronics in Harsh Environments Conference” to be held in Amsterdam, Netherlands, on April 25th, 2018.
Events Calendar | Mon Apr 23 00:00:00 EDT 2018 - Thu Apr 26 00:00:00 EDT 2018 | Shanghai, China
SMTA China East Conference 2018
Industry News | 2017-05-15 16:35:00.0
SMTA China announces that it presented awards for seven papers and two exhibits at the SMTA China East Conference 2017 Award Presentation Ceremony, held on Tuesday, April 25, 2017 at the Shanghai World Expo Exhibition & Convention Center in conjunction with the SMTA China Annual Award Ceremony.
Industry News | 2022-01-10 16:47:42.0
XDry Corp. today announced that Analogic purchased a Dry Box.
Industry News | 2022-01-29 14:38:47.0
At the 65th IPC Annual Meeting on January 25, held in conjunction with IPC APEX EXPO 2022, the IPC Board of Directors announced new officers and members. Board officers serve a two-year term; board members serve a four-year term, and student board member serves a one-year term.
Industry News | 2015-11-25 16:58:05.0
On behalf of the SMTA International Technical Committee, we invite you to submit a 300 word abstract of your research for the 2016 SMTA International 2016 technical conference in Rosemont, Illinois. Papers should describe significant results from experiments, emphasize new techniques, and contain technical, economic or appropriate test data. We are looking for papers on a variety of topics related to electronics manufacturing including advanced packaging/components, assembly, business/supply chain, emerging technologies, harsh environment applications, PCB technology, and process control. Materials must be original, unpublished and non-commercial in nature.
Industry News | 2018-08-02 19:59:54.0
With the YXLON CTScan 3 Yxlon launches its own completely new line detector and replaces the predecessor Y.LineScan. As of now, the CT Compact computer tomography system will be equipped with the new line detector YXLON CTScan 3 as a standard component. In the future, the YXLON FF85 CT and CT Modular systems will also benefit from its capabilities. Ground-breaking technological advancements and optimized production methods deliver unsurpassed image quality, and significantly reduce susceptibility to noise. Beside the interference-resistant and low-noise electronics, the specially developed photodiodes in particular ensure an extremely uniform signal.
3D automated & manual x-ray, Computed Tomography solutions
Technical Library | 2021-03-18 20:07:08.0
X-ray tomography is a promising technique that can provide micron level, internal structure, and three dimensional (3D) information of an integrated circuit (IC) component without the need for serial sectioning or decapsulation. This is especially useful for counterfeit IC detection as demonstrated by recent work. Although the components remain physically intact during tomography, the effect of radiation on the electrical functionality is not yet fully investigated. In this paper we analyze the impact of X-ray tomography on the reliability of ICs with different fabrication technologies.
