Parts & Supplies | Visual Inspection
Supply original new and original used in stocks , We also can repair the Power Supply Power Supply PRN350M parts number 190722 , PC SPARE PSU Power DEK 185605 BOM^LOOM^POWER/TRIGGER^FIREWIRE CAMERA DEK 185122 BOM^PRINT CARRIAGE MOTOR DEK 15
Parts & Supplies | Component Packaging
SAMSUNG FN-14 J7055336A SAMSUNG FN-08 J7055335A SAMSUNG FN-05 J7055334A SAMSUNG AIR TUBE (POLYURETHANE) TU0604B J6713030A SAMSUNG AIR TUBE UB1065B J6713013A SAMSUNG AIR TUBE (POLYURETHANE) TU0805B J6713027A SAMSUNG BALL SPLINE UNIT Z-AXIS J6611
Parts & Supplies | Pick and Place/Feeders
J31521026A SP1 STEP MOTOR DRIVER 4AXIS MD2B-SD15-4X Other Samsung parts: SAMSUNG FN-14 J7055336A SAMSUNG FN-08 J7055335A SAMSUNG FN-05 J7055334A SAMSUNG AIR TUBE (POLYURETHANE) TU0604B J6713030A SAMSUNG AIR TUBE UB1065B J6713013A SAMSUNG AIR
Used SMT Equipment | Repair/Rework
Warranty: 90 days parts & labor against manufacturing defects - wear items not included 1IR550A000A67 1 PC IR550A Infrared Rework System - 115V/US 1600 W heating power -800 W bottom side - 135 x 260 mm -800 W top side - 60 x 60 mm 1 K-type themoco
Industry Directory | Manufacturer
Renishaw has been an innovator in metrology, the science of measurement, enabling measurements to be taken to international standards.The company's first product, the touch-trigger probe for the Rols Royce Olympus engines
As a result of 3 years' R&D effort with some of the industry�s leading names, the CircuitMaster CFA1000 represents the current state of the art in Crimp Force Analysis. The patented 3 zone algorithm combined with application of the latest technology
Parts & Supplies | Other Equipment
DEK 185605 BOM^LOOM^POWER/TRIGGER^FIREWIRE CAMERA DEK 185122 BOM^PRINT CARRIAGE MOTOR DEK 155584 M19PL44 DEK 157317 U/SCREEN CLEANER (ENCODER) OPTO SENSOR LOOM ELA /HORIZON/INFINITY 160555 DEK SMPSU, 650W WIDE RANGE I/P (FASTON TERMS) (TXT)
Used SMT Equipment | In-Circuit Testers
Wavetek 178 The 178 Programmable Waveform Synthesizer is a bench top or ATE programmable instrument that combines the precision of an 8 digit, 50MHz synthesizer with function, signal and sweeper versatility. In addition to sine and square wave to
Used SMT Equipment | In-Circuit Testers
Hioki 8808-01 Memory HiCorder Description The 8808-01 MEMORY HiCORDERs, housed in a B5 book-sized, compact, and thin body weighing in at under 1.2 kg, are handy high-speed recorders equipped with features such as analog 4-channel isolated inp
Technical Library | 2016-04-14 13:49:44.0
A system level test, usually built-in test (BIT), determines that one or more subsystems are faulty. These subsystems sent to the depot or factory repair facility, called units under test (UUTs) often pass that test, an event we call No-Fault-Found (NFF). With more-and more electronics monitored by BIT, it is more likely that an intermittent glitch will trigger a call for a maintenance action resulting in NFF. NFFs are often confused with false alarm (FA), cannot duplicate (CNDs)or retest OK (RTOK) events. NFFs at the depot are caused by FAs, CNDs, RTOKs as well as a number of other complications. Attempting to repair NFF scan waste precious resources, compromise confidence in the product, create customer dissatisfaction, and the repair quality remains a mystery. The problem is compounded by previous work showing that most failure indications calling for repair action at the system level are invalid. NFFs can be caused by real failures or may be a result of system level false alarms. Understanding the cause of the problem may help us distinguish between units under test (UUTs) that we can repair and those that we cannot. In calculating the true cost of repair we must account for wasted effort in attempting to repair unrepairable UUTs.This paper will shed some light on this trade-off. Finally, we will explore approaches for dealing with the NFF issue in a cost effective manner.
