Used SMT Equipment | In-Circuit Testers
Hioki 8808-01 Memory HiCorder Description The 8808-01 MEMORY HiCORDERs, housed in a B5 book-sized, compact, and thin body weighing in at under 1.2 kg, are handy high-speed recorders equipped with features such as analog 4-channel isolated inp
Technical Library | 2016-04-14 13:49:44.0
A system level test, usually built-in test (BIT), determines that one or more subsystems are faulty. These subsystems sent to the depot or factory repair facility, called units under test (UUTs) often pass that test, an event we call No-Fault-Found (NFF). With more-and more electronics monitored by BIT, it is more likely that an intermittent glitch will trigger a call for a maintenance action resulting in NFF. NFFs are often confused with false alarm (FA), cannot duplicate (CNDs)or retest OK (RTOK) events. NFFs at the depot are caused by FAs, CNDs, RTOKs as well as a number of other complications. Attempting to repair NFF scan waste precious resources, compromise confidence in the product, create customer dissatisfaction, and the repair quality remains a mystery. The problem is compounded by previous work showing that most failure indications calling for repair action at the system level are invalid. NFFs can be caused by real failures or may be a result of system level false alarms. Understanding the cause of the problem may help us distinguish between units under test (UUTs) that we can repair and those that we cannot. In calculating the true cost of repair we must account for wasted effort in attempting to repair unrepairable UUTs.This paper will shed some light on this trade-off. Finally, we will explore approaches for dealing with the NFF issue in a cost effective manner.
Used SMT Equipment | In-Circuit Testers
Tektronix DPO4032 The DPO4032 is part of the newest addition to the Tektronix Digital Phosphor Oscilloscopes family, the DPO4000 Series. It is a 350 MHz, 2.5 GS/s, 10 M record length, 2 channel digital phosphor oscilloscope designed specifically
Used SMT Equipment | In-Circuit Testers
Tektronix DPO4032 Bandwidth: 350.0 MHz Channels: 2 The DPO4032 is part of the newest addition to the Tektronix Digital Phosphor Oscilloscopes family, the DPO4000 Series. It is a 350 MHz, 2.5 GS/s, 10 M record length, 2 channel digital phosphor os
Used SMT Equipment | In-Circuit Testers
Tektronix DPO4032 Bandwidth: 350.0 MHz Channels: 2 The DPO4032 is part of the newest addition to the Tektronix Digital Phosphor Oscilloscopes family, the DPO4000 Series. It is a 350 MHz, 2.5 GS/s, 10 M record length, 2 channel digital phosphor os
Parts & Supplies | SMT Equipment
If you are interested,please contact: Email: bunny@goodlucksmt.com Skype: bunnysmt website: www.goodlucksmt.com www.smtsupplier.com ONLINE SHOP: http://www.aliexpress.com/store/1398568 Atten: Bunny DEK 185605 BOM^LOOM^POWER
Industry Directory | Distributor
ESD provides complete turnkey solution to Electronic components distribution, Contract manufacturing and the design and manufacture of Power supplies, we also hold a number of spare for Philips GSM66 and 84VZ and Universal through hole machines
Used SMT Equipment | In-Circuit Testers
Tektronix DPO4104B-L Mixed Signal Oscilloscopes Features Wave Inspector controls provide easy navigation and automated search of waveform data 41 automated measurements, and FFT analysis for simplified waveform analysis 16 digit
New Equipment | Test Equipment
The TDS3000 oscilloscopes are the lowest priced, most portable Digital Phosphor Oscilloscopes (DPOs). Now every design engineer and technician can take advantage of the tremendous benefits of DPOs. DPOs deliver a new level of insight that makes deali
New Equipment | Test Equipment
Unit turns on, but fails SPC. Features: 500 MHz bandwidth 4 channels Max. Sampling rate (1 ch) - 2 GSa/s Simultaneous Max.sampling rate/ch - 1 GSa/s Max.record length - 50000 pt/sec Vertical sensitivity 1 mV/div to
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