Industry Directory | Consultant / Service Provider
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The USB Ports Blocking Software is an excellent software tool which protects your data from theft by employees or other people. If installed on a PC blocks the USB ports on the PC so that if someone tries to copy information on a USB the USB will not
PcbTechSoft Industry Specific Software Solutions for PCB Manufacturers
Electronics Forum | Tue May 10 20:57:17 EDT 2005 | davef
There are BNC / USB convertors on the web. Use your favorite search tool.
Electronics Forum | Wed Mar 28 14:09:04 EDT 2007 | realchunks
Wow, you have a screen printer at home? You must be hardcore! Yes, a USB should work.
Used SMT Equipment | In-Circuit Testers
Configuration: (1) Windows Controller (2) ASRU N Revision USB Cards (2) Control XTp 64 Cards (18) Hybrid Double Density Cards (2) 6624A Power Supplies (1) External Power Bay Condition: Complete & Operationa
Used SMT Equipment | Board Cleaners
Aqueous Technologies Trident III Batch Washer Vintage: 2009 Details: Closed Loop Remote SPC Viewing SPC Data USB Export Power: 208~ 3-Phase ~ 60 Hz
Industry News | 2018-10-18 10:20:21.0
How to get real-time thermal data for a PCB?
Industry News | 2018-10-18 11:17:28.0
Minimum Drill Size and Drill Requirements
Parts & Supplies | SMT Equipment
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Parts & Supplies | SMT Equipment
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Technical Library | 2011-09-26 03:33:31.0
How to repair flash drive documents when missing due to malicious software installations? Company presents drive recovery software to restore digital files and compressed folders from accidently formatted usb removable media drives.
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
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Career Center | San Jose, California USA | Engineering
Headquartered in San Jose, as leading PC component distributor and rank #5 DRAM manufacturer in the worldwide, Ma Labs Inc. has specialized in memory modules since 1985. We provide a full range of memory modules from RDRAM, DDR, SD-RAM, SO-DIMM and F
Career Center | San Jose, California USA | Engineering,Technical Support
1.PC Board Design Engineer DRAM Memory Module, Flash product(Card, SSD, USB) design/Layout. Motherboard and flash controller experience is a plus. BSEE degree. 2.Mechanical Design Engineer Mechanical design, modeling for high volume plastic pa
Career Center | new delhi, India | Engineering,Technical Support
Dear Sir/Madam, I would like to take this opportunity of introducing myself to you. I am Software Developer. Presently I am working with Autometers Alliance Ltd. and looking for a better option that gives me a platform where I can utilize my techni
Career Center | Palm Bay, Florida USA | Engineering,Production
1 year of SMT production experience in a low/med volume, high mix environment. IPC-A-610 Certified Specialist. Reflow profiling experience Heavy CAM programming experience with prototypes and new products
SMTnet Express, May 20, 2021, Subscribers: 27,111, Companies: 11,359, Users: 26,657 Rapid Deployment of Automated Test-System for High-Volume Automotive USB-C Hub Adoption and integration of USB-C chargers and hubs in automotive
SMTnet Express, May 5, 2022, Subscribers: 25,613, Companies: 11,567, Users: 27,202 Electronics Manufacturing Technical Articles Rapid Deployment of Automated Test-System for High-Volume Automotive USB-C Hub Adoption and integration
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QYSMT SOLUTION USA LLC / Qinyi Electronics Co.,Ltd | https://www.qy-smt.com/shop/ze537a-usb-to-dual-rs232-223646?page=162&order=name+desc
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