Technical Library | 2012-08-16 22:38:05.0
First published in the 2012 IPC APEX EXPO technical conference proceedings. The physical mechanisms behind tin whisker formation in pure tin (Sn) films continue to elude the microelectronics industry. Despite modest advances in whisker mitigation techniqu
Industry Directory | Consultant / Service Provider
Winslow Automation has been advancing lead finish and soldering technology for the military and aeropace, telecommunications, medical, and consumer electronics industry since its inception in 1986.
Technical Library | 2023-02-13 19:14:03.0
Technology Focus: Develop and evaluate nanoparticle filled conformal coatings designed to provide long term whisker penetration resistance and coverage on tin rich metal surfaces prone to whisker growth in commercial lead-free electronics used in modern DoD systems. Research Objectives: Identify the fundamental mechanisms by which conformal coatings provide long-term tin whisker penetration resistance and inhibit nucleation/growth. Correlate mechanical properties and coverage thickness to whisker penetration resistance. Project Progress and Results: Functionalized nanosilica and non-functional nanoalumina enhanced polyurethane conformal coatings have shown improved spray coating coverage characteristics and crack resistance during thermal cycling fatigue testing. Lead-free assembly whisker mitigation validation testing is in process. Technology Transition: Current project partners provide coating materials to industry. SERDP test data will be considered during updates to the DoD adopted IPC standards for coating materials and coverage.
Industry News | 2023-07-19 09:52:10.0
The re-balling of BGA components from lead-free to tin-lead solder is a critical requirement by some high-reliability customer applications due to tin-whisker mitigation concerns. This technical paper by Circuit Technology Center discusses the key process steps of this highly specialized process.
Industry News | 2022-01-24 18:01:46.0
Available component modification services utilizing Hentec/RPS Odyssey RHSD systems include BGA de-balling, gold mitigation, lead tinning and tin whisker mitigation.
Technical Library | 2023-02-13 19:04:25.0
The tin whisker phenomenon is a failure mode associated with all electronic devices that use a number of low melting point elements (e.g., Sn, Cd, In) in operations such as soldering. Recognized many years ago, the problem was minimized by adding lead, now identified as a hazardous substance and banned
Technical Library | 2015-06-04 19:10:47.0
Integrators and designers of high-reliability systems exert little or no control over component-level plating processes that affect the propensity for tin whiskering. Challenges of how to assure long-term reliability, while continuing to use COTS parts plated with pure tin, continue to arise. An integrated, quantitative, standardized methodology is proposed whereby mitigation levels can be selected that are appropriate for specific applications of pure tin for given end-uses. A system of hardware end-use classification is proposed, together with recommended appropriate risk mitigation approaches. An updated version of the application-specific risk assessment algorithm is presented together with recommended thresholds for acceptability within the context of the hardware classifications.
Technical Library | 2022-01-26 15:22:33.0
Reliability of conformal coatings used to mitigate tin whisker growth depends on their ability to contain tin whiskers. Two key material properties required to assess the reliability of a polyurethane coating are documented experimentally: adhesion strength and puncture strength. A modified blister test using a predefined blister area is employed to assess the adhesion strength and a puncture test is employed to evaluate the puncture strength of the coating. After measuring the properties at time zero, the coatings are subjected to accelerated testing conditions (high temperature/humidity storage and temperature cycling) and the degradations of the coating properties are documented.
Technical Library | 2016-02-18 18:55:09.0
As lead-free alloys shift into high reliability electronics, the issue of tin whisker growth remains a primary concern among those in the industry. Current research shows that there is no perfect alloy for all cases of electronic usage. Industry leaders and researchers continue to study and search for a lead free alloy that is able to withstand harsh environments while maintaining high reliability.
Technical Library | 2015-10-22 17:37:28.0
The objective of this study is to evaluate conformal coatings for mitigation of tin whisker growth. The conformal coatings chosen for the experiment are acrylic, polyurethane and parylene. Also included in this paper are tin whisker inspection results of tin-plated braiding and wire that was exposed to an environment of 50°C with 50% relative humidity for over five years.
