DEK Squeegee holder for DMB or DPB Squeegee, 170 mm For more information please visit our website
New Equipment | Test Equipment
Integrated Flying Probe Configuration: Goepel CASCON GALAXY integrated with SPEA 4060 ICT configuration: Keysight (Agilent) x1149 Benchtop Configuration: Goepel CASCON GALAXY Asset SCANWORKS
1) High reliability and environmentally friendly 2) Switching power transformer 3) Audio transformer 4) EMI filter 5) Line filter 6) EMC core 7) Zero current and current sensor 8) High frequency transformer
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tape guide (l),mv2vb double 10488s0388
300 mA (JESD78) BENEFITS Reduced Power Consumption High Accuracy Reduce Board Space TTL/1.8-V Logic Compatible High Bandwidth APPLICATIONS Cellular Phones Speaker Headset Switching Audio and Video Signal Routing PCMCIA Cards Battery Operated Syst
SST has the capabilities and expertise to take your outsourcing needs to the ultimate level, with complete product integration. Recognizing the need of original equipment manufacturers looking to streamline their supply chain, SST provides complete p
MODEL 80 - For medium to large boards Overall Dimensions: L: 476 W: 508 D: 457 mm Board Capacity: W: 457 D: 457 mm - Standard card guides are 317,5 mm deep, optional 457 mm guides for very large boards. - 75 numbered slots measure 2,8 x 3,9 mm on a 5
Our range includes board to board and cable to board connectors in a variety of high-reliability, high performance interconnect styles, and industry standard interconnect. Harwin connectors are available from our global distribution network. Harwin
Feature Products FUJI CP6 24*16mm FEEDER Product Description FUJI CP6 24*16mm FEEDER OFFER CP6 12*8,24*8,24*12,32*12,32*16 FEEDERS if you need, please advise us your P/N,thanks in advance. Supply & repair below fuji parts at a lower price: FUJ
New Equipment | Test Equipment
Hioki IM3570 Impedance Analyzers $9995.00 IMPEDANCE ANALYZER IM3570 Single-device solution for high-speed measurement, even when switching between different measurement conditions The need to take readings of multiple parameters under d
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