Used to inspection materials which do not admit x-ray penetration (e.g. ceramics). Also used in device-level inspection for defects and counterfeit detection.
New Equipment | Test Equipment
New in 2015! Datest now offers the following services: Scanning Acoustic Microscopy (C-SAM) Analysis X-ray Fluorescence (XRF) Scanning Electron Microscopy (SEM) Fourier Transform Infrared Spectroscopy (FTIR) Analysis Energy Dispersive X-ra
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