New Equipment | Test Equipment
PM3580/60 - 64 dual-analysis channels with 100MHz timing and 50 MHZ state. More channels let you test more sophisticated circuitry. This model is suitable for logic timing measurements on 8- and 16-bit microprocessors. Unit doesn't pass self test.
New Equipment | Test Equipment
E4861A Main features Data output: differential or single-ended Amplitude: 0.5 to 1.8V pp Conversion time (20%-80%): 90ps typical @ ECL, LVDS Jitter, data mode: <50ps pp Jitter, clock mode: <5ps, rmsFeel free to contact me for more detai
New Equipment | Test Equipment
AQ6315A Main features Wavelength range: 350 to 1750 nm Dynamic range: 40 dB (± 1 nm, 633/1152/1523 nm) Wavelength accuracy: ±0.05 nm (25 ± 5°C, 10/125 SM fiber) Wavelength linearity: ±0.02 nm (1510 to 1570 nm, 10/125 SM fiber) Wavelength repeat
New Equipment | Test Equipment
MP1590B Main features Multi-channel simultaneous testing SDH/SONET, PDH/DSn, OTN jitter performance integrated test instrument Supports 10/100/1000 M, Gigabit and 10 Gigabit Ethernet testing High precision jitter measurementPrice vary with optio
New Equipment | Test Equipment
N9320A Main features Auto tuning - for automatic signal search 9.2 ms non-zero sweep width time One-touch power measurement kit (channel power, ACPR, SEM, OBW, TOI)Price: $3000Price vary with options. Feel free to contact me for more details of
New Equipment | Test Equipment
N9030A Main features Continuous 30 Hz to 13.2 GHz scanning Resolution bandwidth of 1 to 100 Hz digitally implemented for faster measurements Low phase noise and wide dynamic range Precision time base and 1 Hz counter resolution Adjacent channel
New Equipment | Test Equipment
81608B Main features Greater margin through excellent instrument performance: high bandwidth (50 GHz or 35 GHz) receivers, ultra-low residual jitter (< 50 fs typical); adjustable clock recovery peak and loop bandwidth Flexible instrument con
New Equipment | Test Equipment
N5251A Main features Ideal for characterization, modeling and parameter extraction of coaxial or wafer devices Apply precise leveling power to the device for power scanning The only broadband solution that integrates a triaxial bias T-junction t
New Equipment | Test Equipment
P5020A Main features Frequency range: 9 kHz to 4.5 GHz Flexible, high-performance compact VNAs Wide choice of measurement applications for in-depth analysis of RF test results Same intuitive graphical user interface as Yestech's high-performanc
New Equipment | Test Equipment
N4391A Main features 4x 33 GHz system bandwidth, 4 x 40 GHz optical receiver bandwidth 1.8% rms EVM specified typical system noise floor 66 Gbaud symbol rate QPSK: 264 Gbit/s; QAM 16: 512 Gbit/s 66 GHz analysis bandwidth 1528 nm to 1630 nm opti
