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New Equipment | Test Equipment
The Huntron Tracker 2000 provides advanced troubleshooting capabilities to simplify testing newer technology components such as CMOS and MOS circuits. Its built-in pulse generator lets you thoroughly troubleshoot gate-fired devices such as SCRs, TRIA
New Equipment | Test Equipment
The 80E04 is a dual-channel Time Domain Reflectometry (TDR) sampling module. This sampling module provides an acquisition rise time of 17.5 ps or less, with a typical 20 GHz equivalent bandwidth for use in Transmission Line Quality, Impedance Measure
Molex's membrane switches provide durable, lightweight and low-profile options for integrating user interfaces and electronic components into a variety of applications including medical, industrial and commercial products. Molex standard membrane s
New Equipment | Test Equipment
The 80E04 is a dual-channel Time Domain Reflectometry (TDR) sampling module. This sampling module provides an acquisition rise time of 17.5 ps or less, with a typical 20 GHz equivalent bandwidth. Each channel of the 80E04 is capable of generating a
New Equipment | Test Equipment
The TE1000 vector impedance analyzer is a versatile, portable test instrument which enables the user to make highly accurate impedance measurements through VHF RF frequencies. The TE1000 has full vector measurement capability, and accurately resolv
Overview • higher performance than standard 68000 • delivered with fully automated test-bench • complete set of tests The D68000 soft core is binary-compatible with the industry standard 68000 32-bit microcoprocessor. It has a 16-bit data b
Overview The DCAN is a stand-alone controller for the Controller Area Network (CAN) widely used in automotive and industrial applications. DCAN conforms to Bosch CAN 2.0B specification (2.0B Active). Core has simple CPU interface (8/16/32 bit confi
Overview The D8254 is a programmable interval timer/counter, binary compatible with industry standard 82C54. The D8254 solves one of the most common problems in any micro-computer system, the generation of accurate time delays under software control
New Equipment | Solder Materials
Superior Drop Shock Performance AND Thermal Cycling Reliability Current Industry Dilemma The standard set of Pb-free alloys has a dramatic trade-off between thermal cycling and drop testing. Additionally, all these SAC alloys are far inferior to
