New Equipment | Test Equipment
High Accuracy, In-Circuit Test and Functional Test with IEEE, PXI, Boundary Scan and Flash Programming capability for all NPI and Electronic Manufacturing environments, Visiontest, optional fixture capability The Latest Technology in Flying Probe T
New Equipment | Test Equipment
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability. Highest Throughput and Highest Quality Test Non-Multiplexed to 3,456 pins Fast Test Program Generation Safe Back-Driving 10V and Low Voltage Driv
New Equipment | Test Equipment
Press-Down-Unit (PDU) Fixturing system provides lowest cost interface. Combining Economics & Quality in PCB Test Non-Multiplexed to 3,456 pins One Touch Fixture Interface provides fastest change-over times (1,400 nets) Fast Test Program Gene
New Equipment | Test Equipment
High Pin Count, High Performance Tester, Non-multiplexed pin structure, In-Circuit Test, On-Board Programming, IEEE, PXI, Boundary Scan. With the continuous and fast pace of development in the electronic manufacturing the time from design to produc
New Equipment | Test Equipment
Non-Multiplexed (1:1) In-Circuit (ICT), fuctional and hybrid test system with IEEE, PXI, Boundary Scan and Flash Programming. The smallest system of the tester family is the MTS30, which is available in a portable 19” rack format. The complete test
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