New SMT Equipment: optical microscopes (Page 3 of 3)

MacroZoom Unit (MZU 1.3) - Sample Inspection System for Crimp Cross Section Analysis

MacroZoom Unit (MZU 1.3) - Sample Inspection System for Crimp Cross Section Analysis

New Equipment | Cable & Wire Harness Equipment

Overview Microscope for visual analysis of cross-sectional images of crimped connections. Precise results in real-time Simple connection and installation with standard PC Clear illumination with LED ring light Analysis according to

Schleuniger, Inc.

PCBA

PCBA

New Equipment | Assembly Services

Avcom has the capability to assemble through-hole, surface mount and mixed technology boards (including BGAs) and specialize in quick turn and prototype jobs. For large volume jobs Avcom's Fuji Line makes it possible to run 50,000+ components per hou

Avcom SMT, Inc.

Xynetics/Electroglas 1034X Die Prober Test Station

Xynetics/Electroglas 1034X Die Prober Test Station

New Equipment | Test Equipment

Xynetics 1034X Die Prober Test Station with Olympus Microscope head. The eye pieces are Olympus G20x 12.2. We are unable to test this prober. Cables for the controller to connect to the probe station are not available. Contact for freight shipping de

SurplusEQ

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