New Equipment | Test Equipment
HiLevel’s DC3 test system is much more than a high-precision DC parametric measurement unit. By design, it can be integrated with your own logic stimulus equipment to perform DC output tests such as VOH and IOL, providing this capability with high pi
New Equipment | Test Equipment
The HILEVEL CurveMasterTM brings modern technology and components to the world of curve tracing. With up to 2,048 pins and all new high-accuracy DC parametrics, the low-cost CurveMasterTM could become your favorite lab instrument! Curve trace has be
New Equipment | Test Equipment
IQnfc+ Main features Functional test checks basic NFC functionalities through the use of standard protocols Functional verification on all key NFC standards through reduced signaling RF parametric test monitors physical layer quality of DUT Supp
EPD is the base system. Its tools automate PCB design. Parts are parametrically created and stored. The Place command searches libraries and loads parts into the netlist. Colored dynamically optimized rats aid parts placement. Routing with on-line
This module contains all SMT Plus Inc. standard components in EPD/AutoCAD library form. Visual and parametric libraries are provided. Just point and select a desired component from the hundreds of parts available and insert it into your layout drawi
New Equipment | Test Equipment
The HILEVEL Griffin III is a breakthrough in low-cost Test. Up to 512 logic pins, 64M vector depth and capture depth, all new high-accuracy DC parametrics, and optional mixed signal instrumentation in a multi-site system. The Griffin III system
New Equipment | Test Equipment
The Agilent Technologies 8924C CDMA mobile station test set provides the key set of measurements to manufacture high quality dual-mode CDMA mobile telephones in a single box. Acting as a calibrated, high-performance CDMA base station, the 8924C verif
Mechatronika MR10 is a fully programmable far infra red oven, suitable for reflow soldering as well as glue heat drying. Soldering sections are controlled by a microprocessor, that also enables the storage of up to sixteen parametrized temperature
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New Equipment | Test Equipment
Key Features & Specifications Features •Supports GSM/GPRS/EGPRS/E-EDGE, W-CDMA/HSPA/HSPA+, cdma2000®/1xEV-DO/eHRPD, TD-SCDMA/TD-HSDPA/TD-HSUPA, IS-95, TIA/EIA-136 and AMPS wireless device testing. •Software upgradeable for quick access to new func
A modern alternative of the bed-of-nails system, CAMtek offers Flying Probe Test as a universal platform for a cost effective test solution. Dual Side Probing Optical (AOI) Test Open Pin Scan Parametric Test Power-Up Functional Test Capable
