The phoenix microme|x is a high-resolution 180 kV microfocus X-ray inspection system for real time inspection of solder joints and electronic components as well as for automated inspection (µAXI). Innovative and unique features and an extreme high po
GE's phoenix nanotom® s is the first 180 kV/15 W nanofocus computed tomography (nano ct) system perfectly tailored to applications e.g. in material science, precision injection moulding or micromechanics. The nanotom® is the inspection solution for
| 1 |
.gif)
winsouce.jpg)