New SMT Equipment: profilometer (Page 1 of 1)

3D Non Contact Profilometers

3D Non Contact Profilometers

New Equipment | Other

Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano through macro range is obtained during measurement (Profile Dimension, Roughness Finish Texture, Shape Form Topography,

NANOVEA

Laser Technology for In-Line Inspection

Laser Technology for In-Line Inspection

New Equipment |  

Cyber Technologies in-line solutions provide non-contact measurement capability for quickly scanning any surface. The system produces a high-resolution, two-dimensional profile or 3D raster scan. It combines digital laser sensor technology, a compute

Cyber Technologies USA

Lab Testing Services

Lab Testing Services

New Equipment | Test Services

Nanovea offers clients worldwide to an unmatched range of Nano, Micro & Macro Mechanical, Metallurgy, Tribology and 3D Non-Contact or AFM materials characterization. Measurements include: Scratch Adhesion, Indentation Hardness, Wear Friction, Elastic

NANOVEA

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