New SMT Equipment: scanning acoustic microscope (Page 1 of 3)

Scanning Acoustic Microscopy (SAM) analysis

New Equipment | Inspection

Used to inspection materials which do not admit x-ray penetration (e.g. ceramics).  Also used in device-level inspection for defects and counterfeit detection.

Datest

Analytical Services

New Equipment | Test Equipment

New in 2015!  Datest now offers the following services: Scanning Acoustic Microscopy (C-SAM) Analysis X-ray Fluorescence (XRF) Scanning Electron Microscopy (SEM) Fourier Transform Infrared Spectroscopy (FTIR) Analysis Energy Dispersive X-ra

Datest

Revetest (RST)

Revetest (RST)

New Equipment | Test Equipment

The REVETEST® Scratch Testing instrument has become the industry standard for measuring hard-coated materials, with a typical coating thickness of several microns. Coatings may be organic or inorganic, covering Tribological, magnetic and decorative

CSM Instruments

Micro Indenter (MHT)

Micro Indenter (MHT)

New Equipment | Test Equipment

The CSM Instruments Micro-Hardness Tester provides over three decades of normal force range and thus is ideally suited to the mechanical characterization of hard coatings, thick soft coatings and bulk materials. It provides accurate and reproducible

CSM Instruments

Ultra Nanoindenter (UNHT)

Ultra Nanoindenter (UNHT)

New Equipment | Test Equipment

THE NEW GENERATION OF NANOINDENTER CSM Instruments has introduced a new nano range high resolution nanoindenter with ultra low thermal drift. When used per ISO 14577 test methods the Ultra Nano Hardness Tester will provide the most accurate data of

CSM Instruments

Tabletop SEM(Scanning Electron Microscope) SNE-4500M Plus

Tabletop SEM(Scanning Electron Microscope) SNE-4500M Plus

New Equipment | Inspection

SNE-4500M Plus The Highest-end Tabletop SEM Cost-effective Table-top SEM with Max. 150,000x of magnification by miniaturizing modules. Able to scan images with high resolution of 5nm by the installation of the variable aperture with ease of us

SEC

Microsection / Cross-Section Analysis

Microsection / Cross-Section Analysis

New Equipment | Inspection

Please visit our main microsectional analysis page for more information. Process Sciences uses microsection for both  failure analysis and process validation. Our cross sections reveal intermetallic layers, defects, and other physical characteristic

Process Sciences, Inc.

GE BENTLY NEVADA 134652-01 PLC TRANSIENT DATA INTERFACE TDXNET

GE BENTLY NEVADA 134652-01 PLC TRANSIENT DATA INTERFACE TDXNET

New Equipment | Industrial Automation

  Sandy.[mailto:unity@mvme.cn]    Sandy.[WhatsApp/Skype/Mobile:+8618020776786]     Sandy.[Quote to you within the shortest possible time with our best price]   Warranty: up to 12 months Shipping: fast delivery is available NEW+ORIGINAL+IN STOCK+ONE

XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD.

GE BENTLY NEVADA 330103-00-05-10-02-00 PROBE

GE BENTLY NEVADA 330103-00-05-10-02-00 PROBE

New Equipment | Industrial Automation

  Sandy.[mailto:unity@mvme.cn]    Sandy.[WhatsApp/Skype/Mobile:+8618020776786]     Sandy.[Quote to you within the shortest possible time with our best price]   Warranty: up to 12 months Shipping: fast delivery is available NEW+ORIGINAL+IN STOCK+ONE

XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD.

Allen-Bradley 1771-SDN Devicenet Scanner Module

Allen-Bradley 1771-SDN Devicenet Scanner Module

New Equipment | Industrial Automation

Sales Manager: Sandy Lin Email:  unity@mvme.cn Skype:  onlywnn_1 Mobile(Whatsapp): (+86)-18020776786   XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD. is a company that professionally engaged in large system DCS spare parts supply. We supply DCS, PLC, M

XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD.

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