New SMT Equipment: sir measurement (Page 1 of 1)

C3 Critical Cleanliness Control

C3 Critical Cleanliness Control

New Equipment | Test Equipment

Localized Electronics Cleanliness Tester and Residue Extractor The information gathered when using the C3 is intended to provide a measure of the cleanliness of a localized region of a circuit board. In addition, the C3 extracts a sample of the effl

UM Technology Co., Ltd.

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