InspectScan VPI is a fully integrated, stand-alone process control, measurement and inspection and programming workstation for use in setting up processes before the production floor in the PCB or Hybrid Microcircuit assembly industries. InspectScan
New Equipment | Test Equipment
Instant Evaluations With Just One Touch. LCR-Reader from Siborg Systems Inc. is the newest model in the Smart Tweezers line of handheld LCR-meters. The new LCR-Reader features fully automatic L, C, R and ESR measurements. Smart Tweezers have become
New Equipment | Test Equipment
5720A Multifunction Calibrator: The lowest uncertainties of any multifunction calibrator Since its introduction in 1988, the 5700A Multifunction Calibrator has earned a worldwide reputation for performance, dependability and quality, and as a resul
Improve test coverage and reduce cost. The XJTAG XJLink2-CFM adds the power of XJTAG’s boundary scan solution to the Teradyne TestStation, giving test access to hard-to-probe parts of a board. Both JTAG and non JTAG devices, such as Flash, RAM, Eth
Jet printing for high mix production The MY500 Jet Printer is a breakthrough innovation. Well proven on five continents, it shoots solder paste on the fly at split-second speeds while moving above the board. The MY500 is designed to keep pace with
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New Equipment | Assembly Services
Technical requirements: Material: FR-4 Layer: 2 layer Thickness of cooper: 1/1 Oz Thickness of board: 1.6MM Surface finish: HASL LF Min. hole size: 0.25mm Min.line width: 0.15mm Min.line space: 0.15mm Contact way: Mail: sales(at)hitechpcb.com www.h
Laser Depaneling of Populated PCBs Low Cost Option for Depaneling Inexpensive Entry into UV Laser Processing The LPKF MicroLine 1120 S is perfect for cutting break-out tabs and complex contours at highest accuracy. The benefits include shorter
New Equipment | Test Equipment
Improve both board test coverage and test throughput at in-circuit test with i3070 and i1000D ICT systems that offer one of the best ROICs available in the market today. The Medalist i3070, the next generation In-Circuit Test System, enables 20% mo
Highly Accurate Fully Automatic Wafer Inspection with Handling Unit For semiconductor assemblies, the requirement for a precise, thorough inspection for damage and defects during the production process is especially high. Wafers need non-destructive
New Equipment | Test Equipment
The 2800 series of Huntron® Tracker® are designed to complement conventional test instruments in the debug and troubleshooting process. Using the proven power-off test method known as Tracker Signature Analysis it eliminates the risk of further circu
