Featured Lots - FUJI NXT M3/M3S Chip Shooters - FUJI NXT M6/M6S Chip Shooters - FUJI NXT II M3 Chip Shooters - FUJI NXT II M6 Chip Shooters - DEK Screen Printer - Koh Young 'ASPIRE XL', 'KY8030-3' SPI - Agilent / Vitrox AOI - BTU '150N X5', '150N Z1
.png)
New Equipment | Test Equipment
IN-CIRCUIT AND FUNCTIONAL TESTER ICT/FCT PMP-2000/PMP2000L New feature advantage ▶Two-stage pressure table control, the pressure table cylinder rises to the highest point during debugging, which is convenient for debugging the needle bed. In the pro
New Equipment | Test Equipment
Limited access testing using IEEE1149.1 standard are now an essential part of manufacturing test strategy for complex and high node count digital boards. The Boundary scan tools (Scan Pathfinder) provided by Teradyne for the 228x and TestStation seri
New Equipment | Test Equipment
Teradyne’s Spectrum™ 8862 (TSSE) is a unique combinational in-circuit (ICT)/ functional test system that can lower overall costs and test times for manufacturers that prefer to combine functional and ICT test capabilities on a single system. Spectrum
New Equipment | Test Equipment
LED Test solution for ICT, Plastlist based on the experience of inspection over 20 years, pronounce LED tester for ICT. Features: No specified software driver required. Seven colors identification by 7 stepped voltage levels, 0-4V. Intens
Our manufacturing capabilities allow us to support all aspects of the electronics manufacturing process. Our production processes include: High speed continuous flow SMT lines. High Mix SMT and PTH. Automated PTH assembly. Fine Pitch, BGA, CSP, C
New Equipment | Test Equipment
Agilent 3070; Genrad 2287; Teradyne Z1820; Teradyne Z1890; Teradyne Spectrum 88XX - Our original business and still our core business. We can design and deliver finished fixtures and programs to any manufacturing site in the world, or keep them at
New Equipment | Test Equipment
Limited access testing using IEEE1149.1 standard is now an essential part of manufacturing test strategy for complex and high node count digital boards. Teradyne SPECTRUM series of In-Circuit testers provide Boundary Scan capabilities. The SPECTRUM d
Design For Test AB Electronic Assemblies Ltd (ABEA) provides assessment of PCB design in order to maximise testability on either Genrad or Teradyne. This includes recommendations in the following areas: General PCB layout Suitable test point densit
New Equipment | Test Equipment
Teradyne's TestStation Multi-Site systems deliver 2 to 4 times greater test capacity, delivering 200 to 400% greater productivity, and 40 to 50% lower total cost of test compared to a conventional single site system. Supporting a full range of MDA/IC
