New Equipment | Test Equipment
90 dB) enables the S251C to accurately measure antenna-to-antenna isolation in the presence of high RF activity. Data Analysis Software enables assessment of system trends, problems and performance in addition to professional report generation. An op
New Equipment | Test Equipment
The MUST System 3 is the latest technological evolution of the original Multicore Universal Solderability Tester (MUST II) that grandfathered all modern solderability test standards. It remains the unquestioned industry benchmark for solderability te
New Equipment | Test Equipment
State-of-the-art Acquisition System The CSA8200 and TDS8200 Sampling Oscilloscopes are comprehensive acquisition and measurement instruments for research, design evaluation and manufacturing test in the fields of datacom and telecom components, trans
Each high-density GeneChip array provides multiple, independent measurements for each transcript and genotyping call. Multiple probes mean that you get a complete data set with accurate, reliable, reproducible results from every experiment. For more
If you'd like to purchase Wayne's minimal-mathematics, minimal-theory hardbound text �Random Vibration & Shock Testing, Measurement, Analysis & Calibration� in addition to the Distance Learning Program, you can get a discount when buying Combo1.
New Equipment | Test Equipment
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability. HIGHEST THROUGHPUT AND HIGHEST QUALITY TEST Full In-Line Integration Compatible with Lambda Parallel Testing Solutions. Non-Multiplexed to 3,
New Equipment | Test Equipment
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability. Highest Throughput and Highest Quality Test Non-Multiplexed to 3,456 pins Fast Test Program Generation Safe Back-Driving 10V and Low Voltage Driv
New Equipment | Test Equipment
The HP E4402B spectrum analyzer operates between the 9 kHz to 3 GHz freqency range, offers +/- 1 dB amplitude accuracy, 40 updates /sec measurement speed (including over the GPIB), optional 10 MHz res. bandwidth filter, 99 dB third order dynamic rang
Best-in-the-world measurements for 300mm wafers The Cascade Microtech S300 probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug o
New Equipment | Test Equipment
9 kHz-7 GHz Spectrum Analyzer FSP is the ideal partner for both development and production, featuring the smallest level measurement uncertainty in its class, as well as excellent RF characteristics. The FSP is outstanding for its innovative measur
