Electronics Forum: 51.2 (Page 1 of 1)

Re: Thermal testing

Electronics Forum | Thu Jun 24 11:29:50 EDT 1999 | Matt Stump

| Hi | Could anyone tell me where i can find information, in the literature or on the Web, concerning measurements of temperature distribution, expansion, stresses in the substrate and heat sink and on the interface between them, that is all the rang

Agilent SJ50 .dat file

Electronics Forum | Sat Dec 12 04:21:13 EST 2009 | nkohler

Hello, We use SJ50 serie AOIs. I made a program which watches the .dat file and if an algorithm changes then my program makes a log file from the parameters of the modification. I know some numbers are which parameters, but I don't know all. I write

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