Electronics Forum | Thu Mar 19 02:35:48 EDT 2020 | franknguyen
Hi, I got a new project, and need to provide customer the ICT (In-Circuit-Testing), FPT (Flying-Probe-Testing) process quotation. The new PCBA contains analog components, digital components, and some BGAs that can support Boundary Scan. Does anyone
Electronics Forum | Thu Jul 27 16:54:46 EDT 2006 | pjc
In-Circuit test, or ICT, is the most common method of electrical test for an assembled PCB. It is the most comprehensive and accurate method to ensure that both the PWB and components are working to specification. Not all components however can be el
Electronics Forum | Mon Aug 24 11:38:09 EDT 1998 | Ryan Jennens
| | | Any competition for Teradyne on this front? Any users out there with comments? | | | Thanks in advance. | | | G | | G: Does Teradyne make flying probe testers? Dave F | Dave: | From what I hear they have introduced a flying probe tester??? H
Electronics Forum | Fri Jul 03 09:36:45 EDT 1998 | Dave F
| :I am looking for a in circuit test provider doing | bed of nails and/ or boundary scan test in | Northern California. | | Zsolt: Most contract manufactures worth their bromine and chlorine salts have ITC testers and, I guess, would be happy, if
Electronics Forum | Tue Sep 25 08:55:43 EDT 2007 | stepheniii
It's a test technology. It's quite different from either ICT or functional. It's also called boundary scan. The board has to be designed for it. You basically plug the J-tag tester into a port built into the board. It has it's own special niche b
Electronics Forum | Thu Aug 21 08:59:05 EDT 2008 | rway
I would say yes. I don't believe that ICT will every be replaced by boundary scan. Now on some assemblies, boundary scan is viable and certainly a better choice considering test access constraints. But ICT still will play a vital roll in the futur
Electronics Forum | Tue Sep 25 12:32:01 EDT 2007 | chef
I've heard of boundary scan. A flying probe is that way.
Electronics Forum | Fri Nov 18 12:35:15 EST 2011 | rway
As the article eludes to, you still need probe access to measure the pins with TestJet. One thing I wanted to add was the use of JTAG for use with Boundary Scan. Certain devices have JTAG capability, but not all JTAG devices are Boundary Scan compa
Electronics Forum | Tue Sep 26 11:25:20 EDT 2000 | Wolfgang Busko
I forgot: - smallest part you can handle - Rework capabilities (espec. QFP, BGA) - Test capabilities (inline, offline, AOI, X-ray, ICT, boundary scan etc.) Wolfgang
Electronics Forum | Mon Jun 29 13:02:04 EDT 1998 | Zsolt Takacs
:I am looking for a in circuit test provider doing bed of nails and/ or boundary scan test in Northern California. |
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