Electronics Forum | Thu Nov 27 21:25:15 EST 2003 | Al Capone
Has anyone in this forum experience the can soldering defect? The can component is supposed to be placed on top of a group of RF components to protect the frequency from escaping and interfere with the adjacent RF component. After the reflow process,
Electronics Forum | Fri Jun 07 14:05:39 EDT 2024 | davidk
I wanted to open a discussion and ask about opinion: What is a normal result of the inspection of an AOI? How many falls calls per component /opportunity is bad/normal/good? How many defects per component/opportunity is bad/normal/good? What is goo
Electronics Forum | Wed Jun 19 14:40:58 EDT 2024 | davidk
Hello Carl, Thank you for your comment Obviously, we are evolving and debugging our test to get the best results ("no escapes no false calls") :) and using a combination of 3D and 2D tests. With the previous AOI, we had a much higher false call rate,
Electronics Forum | Wed Jul 05 00:57:17 EDT 2000 | Roni Haviv
Hello, I need some information about the DPM of escape defects that were detected in ICT -not including defects that were detected in visual inspection sooner. I'll appreciate any kind of information, Thanks Roni
Electronics Forum | Thu Aug 07 22:56:50 EDT 2008 | dlocampo
First all, you must define the specific defects that you wanted to screen out by your AOI system based on its capability, so you can allocate the undetected defects on your other means of inspection methodology. Then optimize your AOI inspection para
Electronics Forum | Thu Jul 06 15:42:59 EDT 2000 | pr
Check the archives it's loaded with info. good luck
Electronics Forum | Tue Jul 10 19:16:08 EDT 2007 | 5why
We have filed returned (approx. 5%) of the boards that exhibit inner layer short @ a particular connector locations. X-section revealed there exhibit Cu residue, but aside from that, we also suspect there could be organic contaminant, what test shou
Electronics Forum | Mon Apr 17 18:29:03 EDT 2006 | lit
There is learning on all brands requiring fine tuning the test parameters. The first point is not to allow defects to escape. Many brands can do a good job with preventing escapes. The struggle with all the brands becomes false calls. The companies r
Electronics Forum | Sat Apr 21 07:24:01 EDT 2012 | doremi
Just found from another discussion : “The Yestech (pattern match) is very easy to program and use but it took sooooo much up-keep to keep the false calls to a manageable amount. The CyberOptics (also Omron) is more of an algorithm based type of mach
Electronics Forum | Thu Oct 08 13:26:46 EDT 2020 | SMTA-64387994
In particular we are looking to measure the repeatability of the voiding measurements for thermal pads on QFNs. There is some concern that given the nature of AXI programming with upper and lower boundaries set by a programmer to detect a defective s
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