Electronics Forum | Mon Dec 23 00:22:58 EST 2013 | basheermd
One of our production plant is currently using your SEica Flying Probe Tester whose model and serial no. is furnished below. Model S22 MT Serial No. 200594. Now, they want to use it for both bare pcb and assemled pcb testing. Please furnish th
Electronics Forum | Wed Dec 25 02:17:01 EST 2013 | alexeis
Hi, Flying Probe uses only for symptom detection. Do you have software tools for repair station that can helps to your engineering to detect cause? If you need a software tools, feel free to contact me by email: alexeis@proventustech.com. Best Reg
Electronics Forum | Mon Dec 23 07:33:04 EST 2013 | aflex
It totally depends upon the configuration of both bare PCBs and assemble PCBs.
Electronics Forum | Tue Jan 22 09:21:03 EST 2019 | kathylci
Yes, SPEA is what we need now. But also interested in Takaya tech support and other test fixtures.
Electronics Forum | Mon Aug 24 16:23:30 EDT 2015 | aavalle
Hey all, New guy here. I'm working with an Acculogic Sprint 4510 flying prober that I have been tasked with figuring out how to utilize DeltaScan features on. I have been able to get one IC to give me positive feedback in regards to reading back sign
Electronics Forum | Fri Aug 08 11:37:09 EDT 2008 | pjc
Yes, sure. In fact in some applications ICT is coming back. Mainly due to the fact that more and more SMT discrete components have no markings, so AOI cannot tell you if you have the correct value on the PCB. Fixed pin or flying probe ICT is a valuab
Electronics Forum | Tue Mar 23 07:35:42 EDT 2010 | jooh
Since I'm new to the forum I probably ask previously answered questions (that I have not found) but I would be grateful if someone could clarify this for me. I'm in R&D at a company where we design low volume (1k-10k) fairly complex PCBAs for our pr
Electronics Forum | Thu Mar 06 03:46:35 EST 2003 | testing
Thanks for the reply Mike, I will look forward to see the end result of your investigation (e-mail people_1@fsmail.net). Regarding the test machines, I was trying to ask what are the suited/or recommended from your experience, set of test equipment
Electronics Forum | Tue Aug 19 03:35:26 EDT 2008 | dlocampo
But the problem with flying probe is the cycle time. I'm not sure if there is a flying probe out in the market today that can match the cycle time of the conventional bed-of-nails ICT.
Electronics Forum | Thu Aug 21 08:59:05 EDT 2008 | rway
I would say yes. I don't believe that ICT will every be replaced by boundary scan. Now on some assemblies, boundary scan is viable and certainly a better choice considering test access constraints. But ICT still will play a vital roll in the futur
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