Electronics Forum | Thu Sep 20 20:24:09 EDT 2007 | davef
Welcome back to SMTnet, bubba. Depending on your goal select from: * Manufacturing defects tester * In-circuit tester
Electronics Forum | Sat Sep 22 23:57:53 EDT 2007 | accurex
The selection of Test equipment primarily should be driven by the requirement of fault spectrum you would like to capture. If you are looking at Manufacutring defects MDA/ICT would do the job, if you would like to cover the functional aspect a combin
Electronics Forum | Fri Sep 21 11:43:34 EDT 2007 | chef
Thanx Dave- yep- back in the saddle again- kickin' ass, takin' names- should be fun
Electronics Forum | Fri Sep 21 11:46:30 EDT 2007 | chef
Pete- you help is appreciated
Electronics Forum | Mon Sep 24 18:45:03 EDT 2007 | chef
Not yet. What is it? A test technology, a manufacturer of test machines?
Electronics Forum | Tue Sep 25 12:32:01 EDT 2007 | chef
I've heard of boundary scan. A flying probe is that way.
Electronics Forum | Thu Sep 20 14:30:20 EDT 2007 | chef
I would appreciate any and all input on selection of ICT/ATE equipment. I'm a CM supplying various PCA's, none of which are designed with test points. I am looking for a robust, user friendly, low cost, low maintence that can be easily adapted for ea
Electronics Forum | Thu Sep 20 14:58:17 EDT 2007 | jax
For multiple products, none of which have test points, you might want to think about a Flying Probe. Although not as fast as ICT, it should have higher flexibility.It's also easily modified without large tooling/fixture costs.
Electronics Forum | Fri Sep 21 11:48:26 EDT 2007 | chef
My past experience included flying probe- we used it as more an R&D tool, it obvious wasn't fast enough for production. Once the probe gave us the answers need, we then developed the HP 3070 test bed and program.
Electronics Forum | Mon Sep 24 16:32:16 EDT 2007 | stepheniii
Have you looked at J-tag? I have the feeling that ICT use is shrinking and will continue to do so.
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