Electronics Forum | Fri Oct 05 08:35:29 EDT 2001 | PeteC
I believe this machine is now the MPM UP 100 and is supported thru Speedline Technologies-MPM and is now mfg.'d in Franklin Mass.
Electronics Forum | Wed Oct 10 16:50:44 EDT 2001 | jeff
The "UP100 " is currently built by Speedline. However only the models UP100S (No Vision and manual adjust table ) and the UP 100MV (Vision and manual adjust table). These are batch printers not in-line. The IS model has been out of production for ab
Electronics Forum | Wed Mar 05 03:43:58 EST 2003 | testing
Hi, Mike Thanks for the reply With your oracle system were you able to perfom SPC analysis? and if possible do you have any Material that may be helpful for me to get my system setup i.e. whether through Excel, Access, Oracle etc. + What are your
Electronics Forum | Wed Jul 07 13:43:06 EDT 2004 | microniks
Thank you for helping finding a direction for my answer. I found interesting things on fluxes at this site: http://www.smtinfo.net/docs/Electronic%20Production/25.htm Due to the lack of precise and concise information on the subject, I think I will w
Electronics Forum | Mon Mar 03 13:18:02 EST 2003 | msivigny
Hello phil, The use of AOI systems give us the opportunity to auto-collect defect information much the way you're using them now. AOI systems become extremely effective when the collected data is used to perform some positive change into the process.
Electronics Forum | Wed Mar 05 12:23:31 EST 2003 | msivigny
Hello Phil, We did use an Oracle relational database with an Access front end to input and query data from the system for reports. We did not perform SPC with the Oracle dB. As the whole data collection process was completely customized, we hadn't im
Electronics Forum | Wed Nov 18 14:42:22 EST 1998 | Dave F
| I heard somewhere that SMEMA has joined IPC, and that the association has decided to boycott Nepcon from | year 2000. Can anyone tell me if this is true | Nick: SMEMA and IPC are talking about merging (EP&P, 11/98, p 18). Below is a news release
Electronics Forum | Fri Nov 18 12:35:15 EST 2011 | rway
As the article eludes to, you still need probe access to measure the pins with TestJet. One thing I wanted to add was the use of JTAG for use with Boundary Scan. Certain devices have JTAG capability, but not all JTAG devices are Boundary Scan compa
Electronics Forum | Tue Nov 01 13:35:29 EDT 2011 | jwanderl
With TestJet technology, if we want to test a 64 pin BGA, would we need probe access to each net of the device to get full coverage? If not, would I only get coverage to the pins that have probe access? In a nut shell, How exactly does it work?
Electronics Forum | Thu May 21 15:43:18 EDT 2020 | ccouture
That brings me back, I haven't touched one of those in 15 years. But If I remember right, some of the control cards have rechargeable coin cell on board and they might be weak. Do you have access to Panasonic support?
