118 zoom ict probe results

Electronics Forum: zoom ict probe (Page 3 of 12)

No Clean OSP process cause ICT testing issue due to Flux building in testvia hole

Electronics Forum | Fri Mar 29 07:53:12 EDT 2019 | davef

Why are you printing paste on test via? In the old days, we probed soldered pads to cushion impact force of probing. Is that still a reasonable practice?

Re: Flying Probe ICT

Electronics Forum | Fri Aug 21 17:09:07 EDT 1998 | Wayne Bracy

| | Any competition for Teradyne on this front? Any users out there with comments? | | Thanks in advance. | | G | G: Does Teradyne make flying probe testers? Dave F Dave: From what I hear they have introduced a flying probe tester??? Haven't gotte

advice on selecting ATE/ICT

Electronics Forum | Thu Sep 20 14:58:17 EDT 2007 | jax

For multiple products, none of which have test points, you might want to think about a Flying Probe. Although not as fast as ICT, it should have higher flexibility.It's also easily modified without large tooling/fixture costs.

ceramic cap crack

Electronics Forum | Mon Jul 12 00:23:02 EDT 2010 | leadthree

I had cracking caps from the ICT and a variation in the length of the probes (due to wear and tear) that press down the PCB. That put lots of mechanical stress on the PCB. So have also a close look at the ICT, or another other test fixtures you use.

ICT and specifying PCBA testing

Electronics Forum | Fri Mar 26 15:17:30 EDT 2010 | jooh

Thanks for your replies! So what I understand is that ICT in reality is "only" a production process safety net, but it's a net that in most practical cases is needed. What ICT can not catch is (all) bad solder joints. What are the methods to find t

Simulate the cycle time for ICT, FPT tester

Electronics Forum | Thu Mar 19 02:35:48 EDT 2020 | franknguyen

Hi, I got a new project, and need to provide customer the ICT (In-Circuit-Testing), FPT (Flying-Probe-Testing) process quotation. The new PCBA contains analog components, digital components, and some BGAs that can support Boundary Scan. Does anyone

Flying Probe Vrs BON ICT

Electronics Forum | Tue Jan 18 22:24:25 EST 2005 | davef

For comparisons of flying probe versus bed of nails in-circuit test (ICT), look here: * http://evaluationengineering.com/archive/articles/1100ate.htm * http://www.emtonthenet.net/techfeatures/200404april/technicalarticle_Technology_03.htm * http:/

ICT Question, Via holes and Probes

Electronics Forum | Fri Apr 27 08:44:08 EDT 2007 | Brett

For those of you who use via holes as test points, and the via holes must be filled at the wave, is it necessary to have a "dome" on every single test point, or is it sufficient to have the via "filled" with solder? The ICT preson here insists that

Flux residue cause high false reject at ICT

Electronics Forum | Thu Dec 07 10:05:18 EST 2006 | Learn from U

Hi all, Sorry for the late reply..I am sure it is flux residue..Found no such symptom as Grey mention above. This is non clean process and no way we can clean this whole big board(Server) with any kind of flux removal...Currently, the ICT probe pre