Electronics Forum | Wed Jan 04 12:48:34 EST 2006 | pjc
In-Circuit Test is the best method for ensuring solder joint connections. It is a much more reliable than AOI. An ICT machine can ensure solder connections are made for array package devices such as BGA, PGA, etc... AOI is best for component I.D.- is
Electronics Forum | Thu Mar 16 14:04:14 EST 2000 | Cartman
Greetings. My company has a VOC-Free no-clean wave solder flux with 4% solids. I have a number of questions as they relate to our ICT Fixtures. Currently, we're encountering the following issues: 1.) PM on probes....What is the recommended PM p
Electronics Forum | Mon Jun 04 23:52:57 EDT 2012 | rway
Actually, if you experience lack of witness marks, you probably have a problem. Witness marks are OK and will not affect your assembly. I assume this is an SMT assembly we are talking about, in which case, this is what your test pads are for. You
Electronics Forum | Thu Nov 14 09:24:07 EST 2002 | joconnell
What about when debugging the board I recently saw a case where we damaged a board between - 5-10 cycles of the fixture It's a catch 22 - where you need high force probes to breal the OSP - but the copper is hard surface, not like the solder HASL a
Electronics Forum | Tue Jan 18 09:57:43 EST 2005 | Max&paddy
Hi Folks, I am a design engineer trying to evaluate either Flying Probe or the traditional Bed of Nails approach. Has anyone any good websites to evaluate both techniques. I am aware of the reduction in cost due to a fixturless system but the increas
Electronics Forum | Mon Dec 12 13:09:46 EST 2005 | Kris
do you intend to use Immersion tin as a PCB surface finish ? Then Whisker concern is as below if you do not past your test pads, the pads will be stressed when probed on a ICT or a flying probe tester. This is a POTENTIAL for whiskers There is a lo
Electronics Forum | Wed Nov 15 11:42:37 EST 2006 | AndyGAC
I work for an electronics manufacturing plant in North Carolina. We have a Teradyne Javelin 1004 flying probe machine, but we are looking for spare parts for it at a cheaper rate than our initial quote. Do any of you happen to know of any sites on
Electronics Forum | Tue Nov 01 13:35:29 EDT 2011 | jwanderl
With TestJet technology, if we want to test a 64 pin BGA, would we need probe access to each net of the device to get full coverage? If not, would I only get coverage to the pins that have probe access? In a nut shell, How exactly does it work?
Electronics Forum | Tue Jun 05 02:22:07 EDT 2012 | vileo72
Dear Dave/pr/Reese, Thank you so much for the information and this will certainly help me to align on the query .Would like to know further :During Flying probe testing the vias are also observed that they have pin mark on the annular ring due to the
Electronics Forum | Thu Apr 04 10:06:11 EDT 2019 | robl
Hi Vikram, Have you looked at the rotating flux buster style pins? A few people do them, but this is probably the best illustration: https://ingun.com/en/Products/ProductGroups/ICT_FCT/CategoryFolder/RotatingTestProbes We also find that the longer
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