Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2022/04/Void-Reduction-Warpage-Vacuum-Reflow-Soldering.pdf
Vacuum-assisted reflow with convection heating utilizes continuous operation thermal profiles for low COO and high UPH. Recent customer installation showed 10X reduction in voids, meeting specification of <1% total void area
| http://etasmt.com/cc?ID=te_news_bulletin,23577&url=_print
Key Advances in Void Reduction-News-Reflow oven,SMT Reflow Soldering Oven-cmsadmin Reflow oven,SMT Reflow Soldering Oven 当前位置: Home >> News >> News Key Advances in Void Reduction Key Advances in Void Reduction in the Reflow Process Using Multi-Stage Controlled Vacuum This paper explores new advances in the reflow soldering process
| http://etasmt.com:9060/te_news_bulletin/2021-08-31/23577.chtml
%. Another key area to be discussed is the maximizing of the unit per hour (UPH) ofthe system while still achieving the void rate reduction < 1
| http://etasmt.com/te_news_bulletin/2021-08-31/23577.chtml
%. Another key area to be discussed is the maximizing of the unit per hour (UPH) ofthe system while still achieving the void rate reduction < 1
Heller 公司 | http://hellerindustries.com.cn/Vacuum-Void-Reduction-Reflow.pdf
. The Weibull plot illustrates the influence of planar microvoiding on thermal fatigue reliability. The imbedded planar or flat section photomicrographs show the reduction in solder joint attachment area caused by planar voiding
Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/07/Vacuum-Void-Reduction-Reflow.pdf
. The Weibull plot illustrates the influence of planar microvoiding on thermal fatigue reliability. The imbedded planar or flat section photomicrographs show the reduction in solder joint attachment area caused by planar voiding
Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2022/04/Vacuum-Void-Reduction-Reflow-1.pdf
. The Weibull plot illustrates the influence of planar microvoiding on thermal fatigue reliability. The imbedded planar or flat section photomicrographs show the reduction in solder joint attachment area caused by planar voiding