GPD Global | https://www.gpd-global.com/pdf/pbt/Wafer-Option-PBFT-PBT-3000M.pdf
. The WPBFT accommodates 100 mm long wafer chip with widths of 10 mm, 15 mm, 20 mm, 25 mm, and 30 mm. Test results are recorded for incoming or outgoing taped components
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/sonoscan/industries/lighting-and-led?con=t&page=7
: Lighting and LED Gen7 Nordson SONOSCAN FLIP CHIP Nordson SONOSCAN Flip Chip disbonded solder bumps and halo defects - Application Note 354 Publications Nordson SONOSCAN Click on the links below to
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/sonoscan/industries/electronics-assembly-and-packaging?con=t&page=7
DELAMINATIONS Nordson SONOSCAN QFN Lead Delaminations - Application Note 2518 Gen7 Nordson SONOSCAN FLIP CHIP Nordson SONOSCAN Flip Chip disbonded solder bumps and halo defects - Application Note 354 Roadshow T
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/sonoscan/products/acoustic-inspection-systems?con=t&page=6
. Products Content Your results for: Acoustic Inspection Systems MASSIVE VOIDS Nordson SONOSCAN Multi Chip Module (MCM) Die Attach Defects - Application Note 1046 ECHOES UP ECHOES DOWN
PCB Libraries, Inc. | https://www.pcblibraries.com/forum/RSS_altium-0402-resistor-footprint_topic2596.xml
;Every chip package size requires a different solder joint goal and even IPC-7351 does not support that theory. But it's true. There are documents on your computer in this folder
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/first-bond-ball-pull-stud-bump-pull?con=t&page=17
. First bond ball pull testing is predominantly used as an alternative to ball shear testing to verify copper wire ball bonds which is increasingly being as an alternative to gold for semiconductor interconnects
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/first-bond-ball-pull-stud-bump-pull?con=t&page=4
. First bond ball pull testing is predominantly used as an alternative to ball shear testing to verify copper wire ball bonds which is increasingly being as an alternative to gold for semiconductor interconnects
GPD Global | https://www.gpd-global.com/co_website/pdf/pbt/Wafer-Option-PBFT-SPC98-PBT-3029.pdf
. The WPBFT accommodates 100 mm long wafer chip with widths of 10 mm, 20 mm, and 30 mm. Test results are recorded for incoming or outgoing taped components
GPD Global | https://www.gpd-global.com/pdf/pbt/Wafer-Option-PBFT-SPC98-PBT-3029.pdf
. The WPBFT accommodates 100 mm long wafer chip with widths of 10 mm, 20 mm, and 30 mm. Test results are recorded for incoming or outgoing taped components
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/products/jet-cleaners?con=t&page=7
. Fully compatible with MicroDrop drop-jet flux dispenser to verify… Flux Nordson ASYMTEK Efficient application of flux in precise, thin patterns maximizes throughput and quality for flip chip and CSP production Conductive Adhesives Nordson ASYMTEK Nordson ASYMTEK