Surface Mount Technology Association (SMTA) | https://www.smta.org/LED/tech.cfm
. Technical Committee Program Chair: Diganta Das, Ph.D., CALCE University of Maryland Bill Cardoso, Creative Electron Chips Chipalkatti, Ph.D., Dr.Chips Consulting LLC Gyan Dutt, Alpha Assembly Solutions John Radman, NTS-Baltimore Girish Wable, Jabil, Inc
40731 | https://www.smta.org/smtai/SMTAI-2019-Technical-Program.pdf?v=200609010628
Surface Mount Technology Association (SMTA)
40731 | https://www.smta.org/smtai/SMTAI-2019-Technical-Program.pdf?v=200622100619
Surface Mount Technology Association (SMTA)
Surface Mount Technology Association (SMTA) | https://www.smta.org/counterfeit/2019_Counterfeit_Program.pdf
., Creative Electron, Inc. Cu Bond Metal Decap via Wet-etching & Dry-etching Processes Erik Jordan, Nisense REFRESHMENT BREAK Counterfeit Parts Regulations Impacts
40731 | https://www.smta.org/icehet/ICEHET-2020-Program.pdf
Surface Mount Technology Association (SMTA)
Surface Mount Technology Association (SMTA) | https://www.smta.org/counterfeit/register_now.cfm
., Creative Electron Michael Ford, Aegis Corporation Jerry Martinez, Jet Propulsion Laboratory Anthony Mestre, Micross Anne Poncheri, InterCEPT John Radman, NTS Cameron Shearon, Raytheon Kevin Sink, TTI, Inc. Jenny Tsang, U.S
Surface Mount Technology Association (SMTA) | https://www.smta.org/led/
. Technical Committee Program Chair: Diganta Das, Ph.D., CALCE University of Maryland Bill Cardoso, Creative Electron Chips Chipalkatti, Ph.D., Dr.Chips Consulting LLC Gyan Dutt, Alpha Assembly Solutions John Radman, NTS-Baltimore Girish Wable, Jabil, Inc
Lewis & Clark | http://www.lewis-clark.com/category/news/
FEATURING SURPLUS ASSETS AVAILABLE THROUGH THE LOGIC PD CONTINUED IMPROVEMENT PROGRAM FEATURED ITEMS 2015 Creative Electron TruView 200 BGA X-Ray 2012 Mydata My100 SXE-14
Surface Mount Technology Association (SMTA) | https://www.smta.org/knowledge/proceedings_abstract.cfm?PROC_ID=5027
. Cathodic reduction was used to quantitatively determine Ag and Cu corrosion products. Scanning electron microscopy was applied to compare surface morphologies of metal films under various test conditions
Lewis & Clark | http://www.lewis-clark.com/news-info/
FEATURING SURPLUS ASSETS AVAILABLE THROUGH THE LOGIC PD CONTINUED IMPROVEMENT PROGRAM FEATURED ITEMS 2015 Creative Electron TruView 200 BGA X-Ray 2012 Mydata My100 SXE-14
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