Partner Websites: ionic contamination 1.56 (Page 1 of 4)

Cleanliness Test - PCB Libraries Forum

PCB Libraries, Inc. | https://www.pcblibraries.com/forum/cleanliness-test_topic1738_post7101.html

. And J-STD-001F have define ionic residue upper limit value(<1.56 micrograms/cm2) for Static Extraction Methods and manual method

PCB Libraries, Inc.

IPC-5704 vs IPC-6012 Bare Board Cleanliness Comparison - EPTAC - Train. Work Smarter. Succeed

| https://www.eptac.com/faqs/ask-helena-leo/ask/ipc-5704-vs-ipc-6012-bare-board-cleanliness-comparison

: Just going through those two documents, IPC-5704 and both Rev D and Rev C of IPC 6012, and both revisions of 6012 mention: 3.9. The contamination level shall not be greater than an equivalent of 1.56

Ask Helena & Leo (8)

| https://www.eptac.com/faqs/ask-helena-leo/page/8

... Read More Ionic Residue Value Conversion from Metric to English QUESTION Question: Per J-STD-001D, paragraph 8.3.6.2, Static Extraction Method, the contamination shall be less than 1.56 micrograms/cm

IPC-5704 vs IPC-6012 Bare Board Cleanliness Comparison - EPTAC - Train. Work Smarter. Succeed

| https://www.eptac.com/ask/ipc-5704-vs-ipc-6012-bare-board-cleanliness-comparison/

: Just going through those two documents, IPC-5704 and both Rev D and Rev C of IPC 6012, and both revisions of 6012 mention: 3.9. The contamination level shall not be greater than an equivalent of 1.56

SCS Ionograph 500

1st Place Machinery Inc. | http://www.firstplacemachinery.com/scs_ionograph_500_specialty_coating_systems.html

SCS Ionograph 500   Cookson Electronics SCS - Specialty Coating Systems Ionograph 500M Model Number: SMD II Serial Number: 136848 Ionic Contamination Tester Voltage

1st Place Machinery Inc.

Omega Meter 600R

1st Place Machinery Inc. | http://www.firstplacemachinery.com/firstplace_alpha_metals.html

Omega Meter 600R   Alpha Metals Omega Meter   Ionic Contamination Test System to perform Cleanliness Testing  Model Number: 600R Serial Number: 06847 Microprocessor Controlled Power Requirements

1st Place Machinery Inc.

Electronics in Harsh Environments Conference

Surface Mount Technology Association (SMTA) | https://www.smta.org/harsh/tech2018.cfm

. Reliability data using IPC Test Methods and the Bono test data will be presented. Session 3 - Advanced Test Methods + Quantification of ionic contamination present on electronic assemblies is of extreme importance, especially when the end product functions within harsh environments

Surface Mount Technology Association (SMTA)

Microdrop Flux Dispenser

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/select/technologies-or-options/microdrop-flux-dispenser

mitigated by solder nozzle without flux residue or ionic contamination - Compact design allows for easy servicing providing a maintenance-free production environment with minimal machine downtime - Available on Novo ®

ASYMTEK Products | Nordson Electronics Solutions

Electronics in Harsh Environments Conference

Surface Mount Technology Association (SMTA) | https://www.smta.org/harsh/courses.cfm

. The microstructure makes up both electrical and physical connections. Changes can limit the devices useful life. In addition to the microstructure, there are many factors contributing to electrochemical failures on electronic devices including pitch, electrical field, ionic contamination and environmental conditions

Surface Mount Technology Association (SMTA)

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