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: ASTM D790 and D6272 IPC-TM-650 SEMI G86-0303 JEDEC 9702 Download application note Download fixture Datasheet Products Content Your results for
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マイクロ マテリアル試験システムでは、3 点曲げと 4 点曲げの両方を行えます。 外部のセンサーは変位やひずみの検出に利用できます。 プリント回路基板の場合は、接続に障害が発生したら、電気抵抗を使用して試験を中止することができます。 これらのテストは以下の規格に準拠して実施できます。 ASTM D790 および D6272 IPC-TM-650 SEMI G86-0303 JEDEC 9702
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微材料测试系统测试方法包括三点弯曲法和四点弯曲法。 外部传感器可用来感知位移或应变。 对于印刷电路板，一旦连接失败，电阻可用于终止测试。 测试可以按照以下规范执行： ASTM D790 和 D6272 IPC-TM-650 SEMI G86-0303 JEDEC 9702 下载应用说明 下载固定装置数据表 产品 内容 微材料测试 Nordson DAGE 拥有 30 年的小尺寸几何畸变测试经验，是微材料测试领域的先驱，可为多种材料和应用提供无与伦比的专业知识和技能。 Search Again 搜索
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: ASTM D790 and D6272 IPC-TM-650 SEMI G86-0303 JEDEC 9702 Download application note Download fixture Datasheet Products Content Your results for
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: ASTM D790 and D6272 IPC-TM-650 SEMI G86-0303 JEDEC 9702 Download application note Download fixture Datasheet Products Content Your results for
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: ASTM D790 and D6272 IPC-TM-650 SEMI G86-0303 JEDEC 9702 Download application note Download fixture Datasheet Products Content Your results for
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: ASTM D790 and D6272 IPC-TM-650 SEMI G86-0303 JEDEC 9702 Download application note Download fixture Datasheet Products Content Your results for
