ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear?con=t&page=9
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear?con=t&page=1
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear?con=t&page=5
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
Lewis & Clark | https://www.lewis-clark.com/shop/page/7/
– Laser Section Microscope for SPI Make: Cyberoptics Model: LSM 500 Vintage: 1992 Details: Laser Section Microscope Benchtop Condition
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear?con=t&page=8
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear?con=t&page=3
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear?con=t&page=4
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/test-types/bump-shear?con=t
0.25 micron shear height, with step back accuracy, on a S25 gram cartridge. Using a stable dual arm microscope for high power optics and a precision XY stage with micron nudge buttons in X, Y and Vector the bump shear test also utilises a selection of camera systems for load
Lewis & Clark | https://www.lewis-clark.com/product/2009-cyberoptics-se500-spi-solder-paste-inspection/
2.4.1.23.0 Software Condition: Complete & Operational Dropbox Link to additional Photos & Video: https://www.dropbox.com/sh/ou38s42csvg9xra/AAC1eSiw3FkMiPH65PGh9wQ8a?dl=0 Sold
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