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GE Nanotom Computed Tomography Xray Archives - Lewis and Clark

Lewis & Clark | http://www.lewis-clark.com/product-tag/ge-nanotom-computed-tomography-xray/

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GE Nanotom–S :High accuracy Micro-Computed Tomography Xray & Measuring System - Lewis and Clark

Lewis & Clark | https://www.lewis-clark.com/product/ge-nanotom-s-high-accuracy-micro-computed-tomography-xray-measuring-system/

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GE Nanotom–S :High accuracy Micro-Computed Tomography Xray & Measuring System - Lewis and Clark

Lewis & Clark | http://www.lewis-clark.com/product/ge-nanotom-s-high-accuracy-micro-computed-tomography-xray-measuring-system/

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2016 Nikon XT V 160 X-ray System - Lewis and Clark

Lewis & Clark | https://www.lewis-clark.com/product/2016-nikon-xt-v-160-x-ray-system/

& Shipping:  USA / FOB Origin Availability:  Immediate for purchasing / 2-4 weeks for shipping Category: X-Ray Tags: CT Xray Nikon preown xray Prewowned Nikon xray for sale Used xray for sale xray xray system XTV 160 Share this product Share with Twitter Share with Google

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2016 Nikon XT V 160 X-ray System - Lewis and Clark

Lewis & Clark | http://www.lewis-clark.com/product/2016-nikon-xt-v-160-x-ray-system/

& Shipping:  USA / FOB Origin Availability:  Immediate for purchasing / 2-4 weeks for shipping Category: X-Ray Tags: CT Xray Nikon preown xray Prewowned Nikon xray for sale Used xray for sale xray xray system XTV 160 Share this product Share with Twitter Share with Google

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Nordson DAGE 的 Peter Koch 在 EPP 创新论坛上探讨使用 X 射线进行故障分析

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/zh-CN/divisions/dage/about/news/nordson-dages-peter-koch-to-discuss-failure-analysis-with-xray-at-epps-innovations-forum

Nordson Corporation (NASDAQ: NDSN)的子公司,宣布 Peter Koch 将出席计划于 2015 年 3 月 12 日星期四在德国 Böblingen 举行的 EPP 创新论坛,他展示的主题是“在 2D、层成像和 CT 中使用 X 射线进行故障分析”。 Koch 先生将会讨论 BGA 故障、HiP(枕头效应)缺陷、裂缝以及诸如焊桥之类的简单故障。 利用二维检测可以检测到上述大多数故障;但是有时也需要使用其他技术(例如 X-Plane™(层成像)和 CT)。另外,Koch 先生将介绍 BGA 焊球的形状或空隙如何指示出现故障。 他的讲演还将分析不同组件的故障,例如,电阻、电容和线焊。 还将展示 Nordson DAGE X-Plane

ASYMTEK Products | Nordson Electronics Solutions

Nordson DAGE の Peter Koch が EPP の Innovations Forum において X 線による故障解析を語る

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/ja-JP/divisions/dage/about/news/nordson-dages-peter-koch-to-discuss-failure-analysis-with-xray-at-epps-innovations-forum

(NASDAQ: NDSN) は、2015 年 3 月 12 日木曜日にドイツのベーブリンゲンで開催される EPP Innovations Forum にて、Peter Koch が「X 線による故障解析 – 2D、トモシンセシス、CT」のタイトルでプレゼンテーションを行うことを発表しました。 このプレゼンテーションでは、BGA の不良、HiP (ヘッド イン ピロー) 欠陥、亀裂、はんだブリッジなどの単純な不良について解説します。 これらの不良のほとんどは 2D 検査で検出できますが、X-Plane™

ASYMTEK Products | Nordson Electronics Solutions

X-Ray Archives - Lewis and Clark

Lewis & Clark | http://www.lewis-clark.com/product-category/x-ray/

://www.dropbox.com/sh/98q5qyepnba5kt5/AACZyMwYYeuRlrgB2rWCwX0xa?dl=0 Agilent 5DX Xray System Make:  Agilent Model:  5DX Qty:   (2) Available) Vintage: Details: Windows 7 Operating System

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GE Nanome|x X-ray System- 2005 - Lewis and Clark

Lewis & Clark | http://www.lewis-clark.com/product/ge-nanomex-x-ray-system-vintage-2005/

° CT Upgrade Readiness Tilt and Rotate Axis (Heavy Duty) Max Tilt Angle +/- 30° 5 Axis Sample Manipulation Real Time Video Chain Condition

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